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"ENGEL, James E"
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"ENGEL, James E"
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X X-RAY SCATTER SYSTEMS AND METHODS FOR DETECTING STRUCTURAL VARIATIONS
by
ENGEL JAMES E
,
GEORGESON GARY
,
SAFAI MORTEZA
Year of Publication
14.06.2017
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The Learning School: A Guide to Vision-Based Leadership
by
Wallace, Richard C., Jr
,
Engel, David E
,
Mooney, James E
Year of Publication
1997
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Thick doped adhesive tape to enhance backscatter x-ray detectability
by
Engel
,
James E
,
Toh, Chin H
Year of Publication
04.08.2021
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X-ray scatter systems and methods for detecting structural variations
by
GEORGESON, Gary
,
SAFAI, Morteza
,
ENGEL
,
James E
Year of Publication
18.02.2021
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X-RAY SCATTER SYSTEMS AND METHODS FOR DETECTING STRUCTURAL VARIATIONS
by
GEORGESON, Gary
,
SAFAI, Morteza
,
ENGEL
,
James E
Year of Publication
30.12.2020
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X-ray scatter systems and methods for detecting structural variations
by
Engel
,
James E
,
Georgeson, Gary
,
Safai, Morteza
Year of Publication
11.06.2019
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X-ray scatter systems and methods for detecting structural variations
by
GEORGESON, Gary
,
SAFAI, Morteza
,
ENGEL
,
James E
Year of Publication
15.06.2017
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X-RAY SCATTER SYSTEMS AND METHODS FOR DETECTING STRUCTURAL VARIATIONS
by
Engel James E
,
Georgeson Gary
,
Safai Morteza
Year of Publication
01.06.2017
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X-RAY SCATTER SYSTEMS AND METHODS FOR DETECTING STRUCTURAL VARIATIONS
by
GEORGESON, Gary
,
SAFAI, Morteza
,
ENGEL
,
James E
Year of Publication
31.05.2017
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Thick doped adhesive tape to enhance backscatter x-ray detectability
by
Engel
,
James E
,
Toh, Chin H
Year of Publication
31.05.2017
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ZUR THEORIE UND PRAXIS DER FORSCHUNG
by
ENGEL
,
JAMES E
.
Published in
Colloquia Germanica
(01.01.1968)
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Backscatter inspection systems, and related methods
by
Engel James E
,
Edwards William Talion
,
Georgeson Gary
,
Safai Morteza
Year of Publication
26.12.2017
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X-ray backscatter system and method for detecting discrepancies in items
by
Engel James E
,
Edwards William Talion
,
Georgeson Gary E
Year of Publication
18.07.2017
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Thick doped adhesive tape to enhance backscatter X-ray detectability
by
ENGEL JAMES E
,
TOH CHIN H
Year of Publication
09.09.2014
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System and method for quantifying x-ray backscatter system performance
by
Wright, Daniel J
,
Engel
,
James E
,
Wu, Yuan-Jye
,
Georgeson, Gary E
,
Edwards, Talion
,
Lou, Taisia Tsukruk
,
Grimshaw, Matthew T
,
Wright, Rodney S
,
Safai, Morteza
Year of Publication
07.04.2020
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THICK DOPED ADHESIVE TAPE TO ENHANCE BACKSCATTER X-RAY DETECTABILITY
by
ENGEL
,
JAMES E
,
TOH, CHIN H
Year of Publication
04.02.2014
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SYSTEM AND METHOD FOR QUANTIFYING X-RAY BACKSCATTER SYSTEM PERFORMANCE
by
Wright, Daniel J
,
Engel
,
James E
,
Wu, Yuan-Jye
,
Georgeson, Gary E
,
Edwards, Talion
,
Lou, Taisia Tsukruk
,
Grimshaw, Matthew T
,
Wright, Rodney S
,
Safai, Morteza
Year of Publication
02.01.2020
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BACKSCATTER INSPECTION SYSTEMS, AND RELATED METHODS
by
ENGEL JAMES E
,
EDWARDS WILLIAM TALION
,
GEORGESON GARY
,
SAFAI MORTEZA
Year of Publication
12.11.2015
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System and method for quantifying X-ray backscatter system performance
by
Wright, Daniel J
,
Engel
,
James E
,
Wu, Yuan-Jye
,
Georgeson, Gary E
,
Edwards, Talion
,
Lou, Taisia Tsukruk
,
Grimshaw, Matthew T
,
Wright, Rodney S
,
Safai, Morteza
Year of Publication
08.10.2019
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Thick doped adhesive tape to enhance backscatter X-ray detectability
by
ENGEL JAMES E
,
TOH CHIN H
Year of Publication
05.02.2013
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