진공 챔버의 청정도를 모니터링하기 위한 청정도 모니터 및 방법
KRAYVITZ IGOR, RUACH NIR IRIT, EYTAN GUY, RUHLE SVEN, SCHULMAN MAGEN YAACOV, JACOBON EILON MICHAL, RADEK MANUEL
Year of Publication 19.01.2023
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Year of Publication 19.01.2023
Patent
Surface Exchange Effect on Hyper Rayleigh Scattering in CdSe Nanocrystals
Eilon, Michal Jacobsohn, Mokari, Taleb, Banin, Uri
Published in The journal of physical chemistry. B (27.12.2001)
Published in The journal of physical chemistry. B (27.12.2001)
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Journal Article
In-line material analysis of 50nm defects by integration of Energy (EDX) and Wavelength (WDX) Dispersive X-ray analysis
Levin, Lior, Eilon, Michal, Porat, Ronnie, van der Sijs, Arjan, Stegen, Raf, van Brederode, Erik
Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
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Published in 2008 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2008)
Conference Proceeding
CLEANLINESS MONITOR AND A METHOD FOR MONITORING A CLEANLINESS OF A VACUUM CHAMBER
JACOBON-EILON, Michal, KRAYVITZ, Igor, RUACH-NIR, Irit, RADEK, Manuel, EYTAN, Guy, SCHULMAN, Magen Yaacov, RUHLE, Sven
Year of Publication 25.11.2021
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Year of Publication 25.11.2021
Patent
Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber
Ruach-Nir, Irit, Eytan, Guy, Ruhle, Sven, Radek, Manuel, Eilon, Michal, Krivts (Krayvitz), Igor, Schulman, Magen Yaacov
Year of Publication 29.06.2021
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Year of Publication 29.06.2021
Patent