Showing
1 - 8
results of
8
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Page will reload when a filter is removed.
Applied Filters:
Limit to articles with full text available
Page will reload when a filter is removed.
Show filters (1)
Limit to articles with full text available
Search Results - "EDMUND DAVID BLACKSHEAR"
Vyzkoušejte nový nástroj s podporou AI
Summon Research Assistant
BETA
Showing
1 - 8
results of
8
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
NICKEL ALLOY FILMS FOR REDUCED INTERMETALLIC FORMATION ON SOLDER
by
PEDRO ARMENGO CHALCO
,
EDMUND DAVID BLACKSHEAR
Year of Publication
15.10.2002
Get full text
Patent
Save to List
Saved in:
2
Loading…
Nickel alloy films for reduced intermetallic formation in solder
by
Chalco, Pedro Armengo
,
Blackshear
,
Edmund David
Year of Publication
03.09.2002
Get full text
Patent
Save to List
Saved in:
3
Loading…
Nickel alloy films for reduced intermetallic formation in solder
by
CHALCO PEDRO ARMENGO
,
BLACKSHEAR EDMUND DAVID
Year of Publication
03.09.2002
Get full text
Patent
Save to List
Saved in:
4
Loading…
Nickel alloy films for reduced intermetallic formation in solder
by
CHALCO, PEDRO ARMENGO
,
BLACKSHEAR
,
EDMUND DAVID
Year of Publication
21.10.2001
Get full text
Patent
Save to List
Saved in:
5
Loading…
Stress accommodation in electronic device interconnect technology for millimeter contact locations
by
Blackshear
,
Edmund David
,
Cipolla, Thomas Mario
,
Coteus, Paul William
Year of Publication
19.07.2005
Get full text
Patent
Save to List
Saved in:
6
Loading…
Stress accommodation in electronic device interconnect technology for millimeter contact locations
by
COTEUS PAUL WILLIAM
,
BLACKSHEAR EDMUND DAVID
,
CIPOLLA THOMAS MARIO
Year of Publication
19.07.2005
Get full text
Patent
Save to List
Saved in:
7
Loading…
Nickel alloy films for reduced intermetallic formation in solder
by
BLACKSHEAR
;
EDMUND DAVID
,
CHALCO; PEDRO ARMENGO
Year of Publication
10.10.2000
Get full text
Patent
Save to List
Saved in:
8
Loading…
Stress accommodation in electronic device interconnect technology for millimeter contact locations
by
COTEUS PAUL WILLIAM
,
BLACKSHEAR EDMUND DAVID
,
CIPOLLA THOMAS MARIO
Year of Publication
28.06.2001
Get full text
Patent
Save to List
Saved in:
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Clear Filter
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Patent
8 results
8
Subject Area
chemistry
6 results
6
medicine
6 results
6
sciences
6 results
6
Topic
casings or constructional details of electric apparatus
6 results
6
electric techniques not otherwise provided for
6 results
6
electricity
6 results
6
manufacture of assemblages of electrical components
6 results
6
printed circuits
6 results
6
basic electric elements
5 results
5
See more
Language
English
8 results
8
Year of Publication
From:
To:
Database
esp@cenet
6 results
6
USPTO Issued Patents
2 results
2
