Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams
Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.
Published in Journal of microscopy (Oxford) (01.05.1999)
Published in Journal of microscopy (Oxford) (01.05.1999)
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Journal Article
Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining
Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.
Published in Microelectronic engineering (01.09.2001)
Published in Microelectronic engineering (01.09.2001)
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Journal Article
Conference Proceeding
Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)
Dziomba, Th, Sulzbach, Th, Ohlsson, O., Lehrer, Ch, Frey, L., Danzebrink, H. U.
Published in Surface and interface analysis (01.05.1999)
Published in Surface and interface analysis (01.05.1999)
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Journal Article
Conference Proceeding