MnSi nanostructures obtained from epitaxially grown thin films: magnetotransport and Hall effect
Schroeter, D, Steinki, N, Schilling, M, Fernández Scarioni, A, Krzysteczko, P, Dziomba, T, Schumacher, H W, Menzel, D, Süllow, S
Published in Journal of physics. Condensed matter (13.06.2018)
Published in Journal of physics. Condensed matter (13.06.2018)
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Journal Article
Homogeneous Large-Area Quasi-Free-Standing Monolayer and Bilayer Graphene on SiC
Momeni Pakdehi, D, Pierz, K, Wundrack, S, Aprojanz, J, Nguyen, T. T. N, Dziomba, T, Hohls, F, Bakin, A, Stosch, R, Tegenkamp, C, Ahlers, F. J, Schumacher, H. W
Published in ACS applied nano materials (22.02.2019)
Published in ACS applied nano materials (22.02.2019)
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Journal Article
A nanoscale linewidth/pitch standard for high-resolution optical microscopy and other microscopic techniques
Huebner, U, Morgenroth, W, Boucher, R, Meyer, M, Mirandé, W, Buhr, E, Ehret, G, Dai, G, Dziomba, T, Hild, R, Fries, T
Published in Measurement science & technology (01.02.2007)
Published in Measurement science & technology (01.02.2007)
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Journal Article
Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining
Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.
Published in Microelectronic engineering (01.09.2001)
Published in Microelectronic engineering (01.09.2001)
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Journal Article
Conference Proceeding
High‐resolution constant‐height imaging with apertured silicon cantilever probes
Dziomba, T., Danzebrink, H. U., Lehrer, C., Frey, L., Sulzbach, T., Ohlsson, O.
Published in Journal of microscopy (Oxford) (01.04.2001)
Published in Journal of microscopy (Oxford) (01.04.2001)
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Journal Article
Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams
Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.
Published in Journal of microscopy (Oxford) (01.05.1999)
Published in Journal of microscopy (Oxford) (01.05.1999)
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Journal Article
Photopatterning of a monomolecular dye film by means of scanning near-field optical microscopy
NABER, A, DZIOMBA, T, FISCHER, U. C, MAAS, H.-J, FUCHS, H
Published in Applied physics. A, Materials science & processing (01.02.2000)
Published in Applied physics. A, Materials science & processing (01.02.2000)
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Journal Article
A compact sensor head for simultaneous scanning force and near-field optical microscopy
Dal Savio, C., Wolff, H., Dziomba, T., Fuß, H.-A., Danzebrink, H.-U.
Published in Precision engineering (01.04.2002)
Published in Precision engineering (01.04.2002)
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Journal Article
Accurate and traceable calibration of one-dimensional gratings
Dai, Gaoliang, Koenders, Ludger, Pohlenz, Frank, Dziomba, Thorsten, Danzebrink, Hans-Ulrich
Published in Measurement science & technology (01.06.2005)
Published in Measurement science & technology (01.06.2005)
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Journal Article
MnSi-nanostructures obtained from thin films: magnetotransport and Hall effect
Schroeter, D, Steinki, N, Schilling, M, A Fernández Scarioni, Krzysteczko, P, Dziomba, T, Schumacher, H W, Menzel, D, Süllow, S
Published in arXiv.org (05.02.2018)
Published in arXiv.org (05.02.2018)
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Paper
Journal Article
Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM)
Dziomba, Th, Sulzbach, Th, Ohlsson, O., Lehrer, Ch, Frey, L., Danzebrink, H. U.
Published in Surface and interface analysis (01.05.1999)
Published in Surface and interface analysis (01.05.1999)
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Journal Article
Conference Proceeding
Versatile sputtering technology for Al2O3 gate insulators on graphene
Friedemann, M, Woszczyna, M, Müller, A, Wundrack, S, Dziomba, T, Weimann, Th, Seyller, Th, Ahlers, F
Published in arXiv.org (07.10.2011)
Published in arXiv.org (07.10.2011)
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Paper
Journal Article
Dimensional nanometrology at PTB
Danzebrink, H-U, Dai, G., Pohlenz, F., Dziomba, T., Butefisch, S., Flugge, J., Bosse, H.
Published in 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings (01.05.2012)
Published in 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings (01.05.2012)
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Conference Proceeding