Defect-Oriented Test: Effectiveness in High Volume Manufacturing
Hapke, Friedrich, Howell, Will, Maxwell, Peter, Brazil, Edward, Venkataraman, Srikanth, Dutta, Rudrajit, Glowatz, Andreas, Fast, Anja, Rajski, Janusz
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2021)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2021)
Get full text
Journal Article
Leukemia Classification using Transfer Learning Models
Kundu, Srijit, Jash, Diptayan, Dutta, Rudrajit, Kannan, Deeba, Shankar, K.C. Prabu, Yakub, Fitri
Published in 2024 Second International Conference on Advances in Information Technology (ICAIT) (24.07.2024)
Published in 2024 Second International Conference on Advances in Information Technology (ICAIT) (24.07.2024)
Get full text
Conference Proceeding