Advance in multi-hit detection and quantization in atom probe tomography
Da Costa, G, Wang, H, Duguay, S, Bostel, A, Blavette, D, Deconihout, B
Published in Review of scientific instruments (01.12.2012)
Published in Review of scientific instruments (01.12.2012)
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Journal Article
Atom probe tomography quantification of carbon in silicon
Dumas, P., Duguay, S., Borrel, J., Hilario, F., Blavette, D.
Published in Ultramicroscopy (01.01.2021)
Published in Ultramicroscopy (01.01.2021)
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Journal Article
3D analysis of advanced nano-devices using electron and atom probe tomography
Grenier, A., Duguay, S., Barnes, J.P., Serra, R., Haberfehlner, G., Cooper, D., Bertin, F., Barraud, S., Audoit, G., Arnoldi, L., Cadel, E., Chabli, A., Vurpillot, F.
Published in Ultramicroscopy (01.01.2014)
Published in Ultramicroscopy (01.01.2014)
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Journal Article
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials
Rolland, N., Larson, D.J., Geiser, B.P., Duguay, S., Vurpillot, F., Blavette, D.
Published in Ultramicroscopy (01.12.2015)
Published in Ultramicroscopy (01.12.2015)
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Journal Article
Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells
Hernández-Saz, J., Herrera, M., Pizarro, J., Gonzalez, M., Abell, J., Walters, R., Galindo, P.L., Duguay, S., Molina, S.I.
Published in Journal of alloys and compounds (05.07.2019)
Published in Journal of alloys and compounds (05.07.2019)
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Journal Article
Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO2
Demoulin, R., Roussel, M., Duguay, S., Muller, D., Mathiot, D., Pareige, P., Talbot, E.
Published in Microscopy and microanalysis (01.08.2019)
Published in Microscopy and microanalysis (01.08.2019)
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Journal Article
Clustering and nearest neighbour distances in atom-probe tomography
Philippe, T., De Geuser, F., Duguay, S., Lefebvre, W., Cojocaru-Mirédin, O., Da Costa, G., Blavette, D.
Published in Ultramicroscopy (01.09.2009)
Published in Ultramicroscopy (01.09.2009)
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Journal Article
Accuracy of analyses of microelectronics nanostructures in atom probe tomography
Vurpillot, F, Rolland, N, Estivill, R, Duguay, S, Blavette, D
Published in Semiconductor science and technology (01.07.2016)
Published in Semiconductor science and technology (01.07.2016)
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Journal Article
Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells
Hernández-Saz, J., Herrera, M., Pizarro, J., Galindo, P.L., Gonzalez, M., Abell, J., Walters, R.J., Molina, S.I., Duguay, S.
Published in Journal of alloys and compounds (30.09.2018)
Published in Journal of alloys and compounds (30.09.2018)
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Journal Article
Atom-scale compositional distribution in InAlAsSb-based triple junction solar cells by atom probe tomography
Hernández-Saz, J, Herrera, M, Delgado, F J, Duguay, S, Philippe, T, Gonzalez, M, Abell, J, Walters, R J, Molina, S I
Published in Nanotechnology (29.07.2016)
Published in Nanotechnology (29.07.2016)
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Journal Article
3D compositional analysis at atomic scale of InAlGaAs capped InAs/GaAs QDs
Hernández-Saz, J., Herrera, M., Molina, S.I., Stanley, C.R., Duguay, S.
Published in Scripta materialia (01.07.2015)
Published in Scripta materialia (01.07.2015)
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Journal Article
Characterization of Arsenic segregation at Si/SiO2 interface by 3D atom probe tomography
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Conference Proceeding
Journal Article
Atomic-scale study of the role of carbon on boron clustering
Philippe, T., Duguay, S., Grob, J.J., Mathiot, D., Blavette, D.
Published in Thin solid films (26.02.2010)
Published in Thin solid films (26.02.2010)
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Journal Article
Conference Proceeding
Temperature dependence of nucleation rate in a binary solid solution
Wang, H.Y., Philippe, T., Duguay, S., Blavette, D.
Published in Philosophical magazine letters (01.12.2012)
Published in Philosophical magazine letters (01.12.2012)
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Journal Article
Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfaces
PHILIPPE, T, COJOCARU-MIRÉDIN, O, DUGUAY, S, BLAVETTE, D
Published in Journal of microscopy (Oxford) (01.07.2010)
Published in Journal of microscopy (Oxford) (01.07.2010)
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Journal Article
Atomic scale study of a MOS structure with an ultra-low energy boron-implanted silicon substrate
Duguay, S., Ngamo, M., Fazzini, P.F., Cristiano, F., Daoud, K., Pareige, P.
Published in Thin solid films (26.02.2010)
Published in Thin solid films (26.02.2010)
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Journal Article
Conference Proceeding
Retention in metal–oxide–semiconductor structures with two embedded self-aligned Ge-nanocrystal layers
Duguay, S, Burignat, S, Kern, P, Grob, J J, Souifi, A, Slaoui, A
Published in Semiconductor science and technology (01.08.2007)
Published in Semiconductor science and technology (01.08.2007)
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Journal Article