Process for examining mineral samples with X-ray microscope and projection systems
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Year of Publication 29.11.2011
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Year of Publication 29.11.2011
Patent
Process for examining mineral samples with X-ray microscope and projection systems
DUEWER FREDERICK W, YUN WENBING, CASE THOMAS A, CHANG HAUYEE, TKACHUK ANDREI, FESER MICHAEL
Year of Publication 29.11.2011
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Year of Publication 29.11.2011
Patent
Structured anode X-ray source for X-ray microscopy
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Year of Publication 28.10.2008
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Year of Publication 28.10.2008
Patent