Stress analysis and bending tests for GaAs wafers
Dreyer, W., Duderstadt, F., Eichler, S., Jurisch, M.
Published in Microelectronics and reliability (01.05.2006)
Published in Microelectronics and reliability (01.05.2006)
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Journal Article
A mathematical model for impulse resistance welding
Duderstadt, F., Hömberg, D., Khludnev, A. M.
Published in Mathematical methods in the applied sciences (01.06.2003)
Published in Mathematical methods in the applied sciences (01.06.2003)
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Journal Article
A mathematical model for impulse resistance welding
DUDERSTADT, F, HÖMBERG, D, KHLUDNEV, A. M
Published in Mathematical methods in the applied sciences (2003)
Get full text
Published in Mathematical methods in the applied sciences (2003)
Journal Article