Compact Modeling of Single-Event Latchup of Integrated CMOS Circuit
Al Youssef, A., Artola, L., Ducret, S., Hubert, G.
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
SEFI Modeling in Readout Integrated Circuit Induced by Heavy Ions at Cryogenic Temperatures
Artola, L., Ducret, S., Advent, F., Hubert, G., Mekki, J.
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Journal Article
Investigation of Electrical Latchup and SEL Mechanisms at Low Temperature for Applications Down to 50 K
Al Youssef, A., Artola, L., Ducret, S., Hubert, G., Perrier, F.
Published in IEEE transactions on nuclear science (01.08.2017)
Published in IEEE transactions on nuclear science (01.08.2017)
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Journal Article
Displacement Damage Effects in InGaAs Photodiodes due to Electron, Proton, and Neutron Irradiations
Nuns, T., Inguimbert, C., Barbero, J., Moreno, J., Ducret, S., Nedelcu, A., Galnander, B., Passoth, E.
Published in IEEE transactions on nuclear science (01.07.2020)
Published in IEEE transactions on nuclear science (01.07.2020)
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Journal Article
Impact of D-Flip-Flop Architectures and Designs on Single-Event Upset Induced by Heavy Ions
Artola, L., Hubert, G., Ducret, S., Mekki, J., Al Youssef, Ahmad, Ricard, N.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Single-Event Transients in Readout Circuitries at Low Temperature Down to 50 K
Al Youssef, A., Artola, L., Ducret, S., Hubert, G., Buiron, R., Poivey, C., Perrier, F., Parola, S.
Published in IEEE transactions on nuclear science (01.01.2018)
Published in IEEE transactions on nuclear science (01.01.2018)
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Journal Article
Single Event Upset Sensitivity of D-Flip Flop of Infrared Image Sensors for Low Temperature Applications Down to 77 K
Artola, L., Hubert, G., Gilard, O., Ducret, S., Perrier, F., Boutillier, M., Garcia, P., Vignon, G., Baradat, B., Ricard, Nicolas
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Low Temperature Total Dose Irradiation of Transistors for Infrared Applications
Nuns, T., David, J.-P, Soonckindt, S., Gilard, O., Perrier, F., Ducret, S., Sanchez, K.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
French Swiss physicians' attitude toward palliative sedation: Influence of prognosis and type of suffering
Beauverd, M., Bernard, M., Currat, T., Ducret, S., Foley, R.A., Borasio, G.D., Blondeau, D., Dumont, S.
Published in Palliative & supportive care (01.10.2014)
Published in Palliative & supportive care (01.10.2014)
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Journal Article
Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
Boch, J., Saigne, F., Schrimpf, R.D., Vaille, J.-R., Dusseau, L., Ducret, S., Bernard, M., Lorfevre, E., Chatry, C.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Friction and abrasive wear of UHWMPE sliding on ice
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Journal Article
Conference Proceeding
Engineering TID modeling for the SEE and performances evaluations of integrated CMOS circuits at cryogenic temperatures
Artola, L., Ducret, S., Hubert, G.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
Effect of switching from high to low dose rate on linear bipolar technology radiation response
Boch, J., Saigne, F., Schrimpf, R.D., Fleetwood, D.M., Ducret, S., Dusseau, L., David, J.P., Fesquet, J., Gasiot, J., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.10.2004)
Published in IEEE transactions on nuclear science (01.10.2004)
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Journal Article
Total dose effects on bipolar integrated circuits: characterization of the saturation region
Boch, J., Saigne, F., Ducret, S., Schrimpf, R.D., Fleetwood, D.M., Iacconi, P., Dusseau, L.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
Hardening of a radiation sensor based on optically stimulated luminescence
Vaille, J.-R., Ducret, S., Idri, K., Saigne, F., Matias, S., Iborra, N., Germanicus, R., Ecoffet, R., Dusseau, L.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
Effect of thermal annealing on radiation-induced degradation of bipolar technologies when the dose rate is switched from high to low
Ducret, S., Saigne, F., Boch, J., Schrimpf, R.D., Fleetwood, D.M., Vaille, J.R., Dusseau, L., David, J.P., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article