A New BJT Selector for sub-0.02µm2 High Density Embedded PCM Memory in FDSOI CMOS Technology
Weber, O., Pigot, C., Berthelon, R., Gandolfo, A., Mattavelli, P., Jasse, J., Samanni, G., Gomiero, E., Richard, E., Grenier, J. C., Ranica, R., Chouteau, S., Beneyton, R., Duclaux, B., Beylier, C., Pelissier, D., Gallon, C., Toulouse, C., Jenny, C., Croisy, M., Borowiak, C., Haendler, S., Ogier, J.L., Batail, E., Gilibert, F., Boivin, P., Turgis, D., Conte, A., Disegni, F., Redaelli, A., Annunziata, R., Cappelletti, P., Piazza, F., Ferreira, P., Arnaud, F.
Published in 2021 Symposium on VLSI Technology (13.06.2021)
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Published in 2021 Symposium on VLSI Technology (13.06.2021)
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Embedded Select in Trench Memory (eSTM), best in class 40nm floating gate based cell: a process integration challenge
Niel, S., Rosa, F. La, Regnier, A., Mantelli, M., Trenteseaux, F., Ghezzi, G., Marzaki, A., Hubert, Q., Delalleau, J., Cabout, T., Maugain, F., Lepape, E., Baron, L., Champenois, A., Galpin, D., Cherault, N., Audran, S., Parmigiani, L., Gouraud, P., Duclaux, B., Escarabajal, Y., Baudin, F., Beche, E., Saidi, B., Arnal, V.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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