by Youngdon Choi, Ickhyun Song, Mu-Hui Park, Hoeju Chung, Sanghoan Chang, Beakhyoung Cho, Jinyoung Kim, Younghoon Oh, Duckmin Kwon, Jung Sunwoo, Junho Shin, Yoohwan Rho, Changsoo Lee, Min Gu Kang, Jaeyun Lee, Yongjin Kwon, Soehee Kim, Jaehwan Kim, Yong-Jun Lee, Qi Wang, Sooho Cha, Sujin Ahn, Horii, Hideki, Jaewook Lee, Kisung Kim, Hansung Joo, Kwangjin Lee, Yeong-Taek Lee, Jeihwan Yoo, Jeong, G.
Published in 2012 IEEE International Solid-State Circuits Conference (01.02.2012)