Thin MLCC (multi-layer ceramic capacitor) reliability evaluation using an accelerated ramp voltage test
Scarpulla, John, Ayvazian, Talin, Buell, Walter, Campbell, Megan, Dubitsky, Andrei, Lin, Rebecca, Martin, Wayne, Moss, Steven, Nuccio, Scott, Yarbrough, Allyson, Young, Jeremy
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Get full text
Conference Proceeding