by Venkatraman, R., Castagnetti, R., Kobozeva, O., Duan, F.L., Kamath, A., Sabbagh, S.T., Vilchis-Cruz, M.A., Liaw, J.J., Jyh-Cheng You, Ramesh, S.
Published in IEEE transactions on electron devices (01.02.2005)

by Ioannou, D.E., Duan, F.L., Sinha, S.P., Zaleski, A.
Published in IEEE transactions on electron devices (01.05.1998)

by Duan, F.L., Zhao, X., Ioannou, D.E.
Published in 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) (1998)

by Duan, F.L., Sinha, S.P., Ioannou, D.E., Brady, F.T.
Published in IEEE transactions on electron devices (01.06.1997)

by Zhao, X., Duan, F.L., Thanailakis, A., Ioannou, D.E., Lawrence, R.K., Hughes, H.L.
Published in 1997 IEEE International SOI Conference Proceedings (1997)

by Ioannou, D.E., Duan, F.L., Jenkins, W.C., Hughes, H.L.
Published in 28th European Solid-State Device Research Conference (1998)

by Sinha, S.P., Duan, F.L., Ioannou, D.E., Jenkins, W.C., Hughes, H.L.
Published in 1996 IEEE International SOI Conference Proceedings (1996)

by Duan, F.L., Ioannou, D.E., Jenkins, W.C., Hughes, H.L., Liu, M.S.T.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)

by Sinha, S.P., Duan, F.L., Ioannou, D.E., Jenkins, W.C., Hughes, H.L.
Published in 1995 IEEE International SOI Conference Proceedings (1995)