Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area
Chen, Shuming, Du, Yankang, Liu, Biwei, Qin, Junrui
Published in IEEE transactions on nuclear science (01.02.2014)
Published in IEEE transactions on nuclear science (01.02.2014)
Get full text
Journal Article
Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology
Yibai, He, Shuming, Chen, Jianjun, Chen, Yaqing, Chi, Bin, Liang, Biwei, Liu, Junrui, Qin, Yankang, Du, Pengcheng, Huang
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
Get full text
Journal Article
A mixed-level framework to estimate SER induced by SEMT in advanced technologies
Biwei, Liu, Yankang, Du, Liping, Wang
Published in International journal of electronics (03.05.2016)
Published in International journal of electronics (03.05.2016)
Get full text
Journal Article
Flip-flops soft error rate evaluation approach considering internal single-event transient
Song, RuiQiang, Chen, ShuMing, He, YiBai, Du, YanKang
Published in Science China. Information sciences (01.06.2015)
Published in Science China. Information sciences (01.06.2015)
Get full text
Journal Article
Effect of p-well contact on n-well potential modulation in a 90 nm bulk technology
Du, YanKang, Chen, ShuMing, Liu, BiWei, Liang, Bin
Published in Science China. Technological sciences (01.04.2012)
Published in Science China. Technological sciences (01.04.2012)
Get full text
Journal Article
Novel time redundant flip-flop structure to attenuate the single-event transient
Chunmei Hu, Yankang Du, Jianjun Chen, Yaqing Chi, Haiyan Chen
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Get full text
Conference Proceeding
Simulation Study of Node-State Transition Effect on the Single-Event Transient
Biwei, Liu, Yankang, Du, Zhao, Li, Lei, Li
Published in IEEE transactions on device and materials reliability (01.09.2015)
Published in IEEE transactions on device and materials reliability (01.09.2015)
Get full text
Magazine Article
PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level
Ruiqiang, Song, Shuming, Chen, Yankang, Du, Pengcheng, Huang, Jianjun, Chen, Yaqing, Chi
Published in IEEE transactions on device and materials reliability (01.12.2015)
Published in IEEE transactions on device and materials reliability (01.12.2015)
Get full text
Magazine Article
Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology
Qin, Junrui, Chen, Shuming, Liang, Bin, Ge, Zhen, He, Yibai, Du, Yankang, Liu, Biwei, Chen, Jianjun, Li, Dawei
Published in IEEE transactions on device and materials reliability (01.03.2014)
Published in IEEE transactions on device and materials reliability (01.03.2014)
Get full text
Magazine Article
System exception reporting method and device
LIU DONGPEI, SONG KE, WANG XIN, SHEN JIANLIANG, LI PEIJIE, CHEN TING, DONG CHUNLEI, LIU QINRANG, ZHANG WENJIAN, LYU PING, DU YANKANG
Year of Publication 30.11.2018
Get full text
Year of Publication 30.11.2018
Patent
Pseudo industrial control processor and data processing method
SHEN JIANLIANG, ZHANG XINGMING, TAN LIBO, DONG CHUNLEI, WANG PAN, LYU PING, ZHANG FAN, SONG KE, WEI SHUAI, JIANG HAIBIN, LIU QINRANG, WU JIANGXING, ZHU KE, GAO YANZHAO, DU YANKANG
Year of Publication 01.03.2019
Get full text
Year of Publication 01.03.2019
Patent
Reconfigurable computation structure meeting requirement for arbitrary-dimension convolution and computation scheduling method and device
YU HONG, ZHANG XINGMING, HUANG YAJING, ZHAO BO, YANG KUN, TANG XIANTUO, ZHANG WENJIAN, GAO YANZHAO, DU YANKANG, ZHANG FAN
Year of Publication 19.12.2017
Get full text
Year of Publication 19.12.2017
Patent