Resolving the time when an electron exits a tunnelling barrier
Shafir, Dror, Soifer, Hadas, Bruner, Barry D., Dagan, Michal, Mairesse, Yann, Patchkovskii, Serguei, Ivanov, Misha Yu, Smirnova, Olga, Dudovich, Nirit
Published in Nature (London) (17.05.2012)
Published in Nature (London) (17.05.2012)
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Journal Article
Subcycle control of electron-electron correlation in double ionization
Zhang, Li, Xie, Xinhua, Roither, Stefan, Zhou, Yueming, Lu, Peixiang, Kartashov, Daniil, Schöffler, Markus, Shafir, Dror, Corkum, Paul B, Baltuška, Andrius, Staudte, André, Kitzler, Markus
Published in Physical review letters (16.05.2014)
Published in Physical review letters (16.05.2014)
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Journal Article
Multidimensional high harmonic spectroscopy
Bruner, Barry D, Soifer, Hadas, Shafir, Dror, Serbinenko, Valeria, Smirnova, Olga, Dudovich, Nirit
Published in Journal of physics. B, Atomic, molecular, and optical physics (14.09.2015)
Published in Journal of physics. B, Atomic, molecular, and optical physics (14.09.2015)
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Journal Article
Spatio-spectral analysis of ionization times in high-harmonic generation
Soifer, Hadas, Dagan, Michal, Shafir, Dror, Bruner, Barry D., Ivanov, Misha Yu, Serbinenko, Valeria, Barth, Ingo, Smirnova, Olga, Dudovich, Nirit
Published in Chemical physics (12.03.2013)
Published in Chemical physics (12.03.2013)
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Journal Article
Resolving the time when an electron exits a tunnelling barrier
Shafir, Dror, Soifer, Hadas, Bruner, Barry D, Dagan, Michal, Mairesse, Yann, Patchkovskii, Serguei, Ivanov, Misha Yu, Smirnova, Olga, Dudovich, Nirit
Published in Nature (London) (17.05.2012)
Published in Nature (London) (17.05.2012)
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Journal Article
Implementation of Spectral Interferometry for Enhanced Critical Dimensions Optical Metrology
Shafir, Dror, Shtainman, Roy, Turovets, Igor
Published in 2021 China Semiconductor Technology International Conference (CSTIC) (14.03.2021)
Published in 2021 China Semiconductor Technology International Conference (CSTIC) (14.03.2021)
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Conference Proceeding
Spatial control of electronic wave packets with attosecond precision
Zhang, Li, Xie, Xinhua, Roither, Stefan, Kartashov, Daniil, Schöffler, Markus, Shafir, Dror, Corkum, Paul, Baltuška, Andrius, Staudte, André, Kitzler, Markus
Published in Journal of physics. Conference series (01.01.2012)
Published in Journal of physics. Conference series (01.01.2012)
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Journal Article
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
YACHINI, Michal Haim, BARAK, Gilad, SHAFIR, Dror, WOLFLING, Shay, SENDELBACH, Matthew, BOZDOG, Cornel
Year of Publication 10.10.2024
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Year of Publication 10.10.2024
Patent
METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES
Szafranek, Dana, Heilpern, Tal, Gorohovsky, Zvi, Ofek, Jacob, BARAK, Gilad, SHAFIR, Dror, Peimer, Daphna, Ferber, Smadar
Year of Publication 15.08.2024
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Year of Publication 15.08.2024
Patent
Method and system for optical characterization of patterned samples
Barak, Gilad, Yachini, Michal Haim, Bozdog, Cornel, Wolfling, Shay, Shafir, Dror, Sendelbach, Matthew
Year of Publication 30.01.2024
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Year of Publication 30.01.2024
Patent
Time-domain optical metrology and inspection of semiconductor devices
SHAFIR Dror, SZAFRANEK Dana, FERBER Smadar, HEILPERN Tal, GOROHOVSKY Zvi, PEIMER Daphna, OFEK Jacob, BARAK Gilad
Year of Publication 01.01.2024
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Year of Publication 01.01.2024
Patent
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
GROSSMAN, Danny, BERLATZKY, Yoav, BARAK, Gilad, SHAFIR, Dror, HAINICK, Yanir
Year of Publication 25.11.2021
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Year of Publication 25.11.2021
Patent
Optical phase measurement method and system
Barak, Gilad, Hainick, Yanir, Shafir, Dror, Grossman, Danny, Berlatzky, Yoav
Year of Publication 08.06.2021
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Year of Publication 08.06.2021
Patent
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
HEILPERN, Tal, PEIMER, Daphna, BARAK, Gilad, SHAFIR, Dror, GOROHOVSKY, Zvi, SZAFRANEK, Dana, OFEK, Jacob, FERBER, Smadar
Year of Publication 08.12.2022
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Year of Publication 08.12.2022
Patent