Predicting variability in nanoscale lithography processes
Drmanac, Dragoljub Gagi, Liu, Frank, Wang, Li-C.
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
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Conference Proceeding
Innovative practices session 5C: Machine learning and data analysis in test
Biswas, Sounil, Carulli, John, Drmanac, Dragoljub Gagi, Bhattacherjee, Arpan
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)
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Conference Proceeding
Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study
Drmanac, Dragoljub, Laisne, M., Wang, Li C.
Published in 2011 IEEE International Test Conference (01.09.2011)
Published in 2011 IEEE International Test Conference (01.09.2011)
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Conference Proceeding
A Study of Outlier Analysis Techniques for Delay Testing
Wu, S.H., Drmanac, D., Wang, L.-C.
Published in 2008 IEEE International Test Conference (01.10.2008)
Published in 2008 IEEE International Test Conference (01.10.2008)
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Conference Proceeding
Understanding customer returns from a test perspective
Sumikawa, N, Drmanac, D, Wang, L, Winemberg, L, Abadir, M S
Published in 29th VLSI Test Symposium (01.05.2011)
Published in 29th VLSI Test Symposium (01.05.2011)
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Conference Proceeding
Online selection of effective functional test programs based on novelty detection
Po-Hsien Chang, Drmanac, D, Li-C Wang
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
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Conference Proceeding
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch
Callegari, Nicholas, Drmanac, Dragoljub, Li-C Wang, Abadir, Magdy S
Published in Design Automation Conference (01.06.2010)
Published in Design Automation Conference (01.06.2010)
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Conference Proceeding
Mining AC delay measurements for understanding speed-limiting paths
Chen, Janine, Bolin, B, Li-C Wang, Jing Zeng, Drmanac, D, Mateja, M
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
Important test selection for screening potential customer returns
Sumikawa, Nik, Drmanac, Dragoljub, Wang, Li-C., Winemberg, LeRoy, Abadir, Magdy S.
Published in Proceedings of 2011 International Symposium on VLSI Design, Automation and Test (01.04.2011)
Published in Proceedings of 2011 International Symposium on VLSI Design, Automation and Test (01.04.2011)
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Conference Proceeding
A non-parametric approach to behavioral device modeling
Drmanac, Dragoljub, Bolin, Brendon, Wang, Li-C
Published in 2010 11th International Symposium on Quality Electronic Design (ISQED) (01.03.2010)
Published in 2010 11th International Symposium on Quality Electronic Design (ISQED) (01.03.2010)
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Conference Proceeding