Geant4 silver anniversary: 25 years enabling scientific production
Basaglia, T., Bell, Z.W., D'Agostino, D., Dressendorfer, P.V., Pia, M.G., Ronchieri, E.
Published in Journal of instrumentation (01.01.2024)
Published in Journal of instrumentation (01.01.2024)
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Journal Article
Scholarly literature and the press: scientific impact and social perception of physics computing
Pia, M G, Basaglia, T, Bell, Z W, Dressendorfer, P V
Published in Journal of physics. Conference series (01.01.2014)
Published in Journal of physics. Conference series (01.01.2014)
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Journal Article
Publication patterns in HEP computing
Pia, M G, Basaglia, T, Bell, Z W, Dressendorfer, P V
Published in Journal of physics. Conference series (01.01.2012)
Published in Journal of physics. Conference series (01.01.2012)
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Journal Article
Correlating the Radiation Response of MOS Capacitors and Transistors
Winokur, P. S., Schwank, J. R., McWhorter, P. J., Dressendorfer, P. V., Turpin, D. C.
Published in IEEE transactions on nuclear science (01.01.1984)
Published in IEEE transactions on nuclear science (01.01.1984)
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Journal Article
Writing Software or Writing Scientific Articles?
Basaglia, T., Bell, Z.W., Dressendorfer, P.V., Larkin, A., Pia, M.G.
Published in IEEE transactions on nuclear science (01.04.2008)
Published in IEEE transactions on nuclear science (01.04.2008)
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Journal Article
A Reevaluation of Worst-Case Postirradiation Response for Hardened MOS Transistors
Fleetwood, D. M., Dressendorfer, P. V., Turpin, D. C.
Published in IEEE transactions on nuclear science (01.12.1987)
Published in IEEE transactions on nuclear science (01.12.1987)
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Journal Article
Physical Mechanisms Contributing to Device "Rebound"
Schwank, J. R., Winokur, P. S., McWhorter, P. J., Sexton, F. W., Dressendorfer, P. V., Turpin, D. C.
Published in IEEE transactions on nuclear science (01.01.1984)
Published in IEEE transactions on nuclear science (01.01.1984)
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Journal Article
Geant4 Silver Anniversary: Science Production with a Simulation System
Pia, M.G., Basaglia, T., Bell, Z. W., Dressendorfer, P. V., Ronchieri, E.
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
Published in 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (04.11.2023)
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Conference Proceeding
High performance microsystem packaging: A perspective
Romig, A.D., Dressendorfer, P.V., Palmer, D.W.
Published in Microelectronics and reliability (01.10.1997)
Published in Microelectronics and reliability (01.10.1997)
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Journal Article
Conference Proceeding
Total-dose radiation-induced degradation of thin film ferroelectric capacitors
Schwank, J.R., Nasby, R.D., Miller, S.L., Rodgers, M.S., Dressendorfer, P.V.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
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Journal Article
Conference Proceeding
Arsenic-implanted thin film PECVD semi-insulating polysilicon (SIPOS) resistors
ONG, P. H, ANG, S. S, BROWN, W. D, NASEEM, H. A, ULRICH, R. K, DRESSENDORFER, P. V
Published in Journal of electronic materials (01.02.1991)
Published in Journal of electronic materials (01.02.1991)
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Journal Article
Implementing QML for radiation hardness assurance
Winokur, P.S., Sexton, F.W., Fleetwood, D.M., Terry, M.D., Shaneyfelt, M.R., Dressendorfer, P.V., Schwank, J.R.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
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Journal Article
Conference Proceeding
Radiation-Induced Interface-State Generation in MOS Devices
Schwank, J. R., Winokur, P. S., Sexton, F. W., Fleetwood, D. M., Perry, J. H., Dressendorfer, P. V., Sanders, D. T., Turpin, D. C.
Published in IEEE transactions on nuclear science (01.12.1986)
Published in IEEE transactions on nuclear science (01.12.1986)
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Journal Article
The Effects of Test Conditions on MOS Radiation-Hardness Results
Dressendorfer, P. V., Soden, J. M., Harrington, J. J., Nordstrom, T. V.
Published in IEEE transactions on nuclear science (01.01.1981)
Published in IEEE transactions on nuclear science (01.01.1981)
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Journal Article