Processor-based built-in self-test for embedded DRAM
Dreibelbis, J., Barth, J., Kalter, H., Kho, R.
Published in IEEE journal of solid-state circuits (01.11.1998)
Published in IEEE journal of solid-state circuits (01.11.1998)
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Journal Article
Disease course unaltered by a single intracisternal injection of BMP-7 in ALS mice
Dreibelbis, J.E., Brown Jr, R.H., Pastuszak, K.A., Smith, E.R., Kaplan, P.L., Cudkowicz, M.E.
Published in Muscle & nerve (01.01.2002)
Published in Muscle & nerve (01.01.2002)
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Journal Article
Embedded DRAM built in self test and methodology for test insertion
Jakobsen, P., Dreibelbis, J., Pomichter, G., Anand, D., Barth, J., Nelms, M., Leach, J., Belansek, G.
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
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Conference Proceeding
A 500-MHz multi-banked compilable DRAM macro with direct write and programmable pipelining
Barth, J.E., Anand, D., Burns, S., Dreibelbis, J.H., Fifield, J.A., Gorman, K., Nelms, M., Nelson, E., Paparelli, A., Pomichter, G., Pontius, D.E., Sliva, S.
Published in IEEE journal of solid-state circuits (01.01.2005)
Published in IEEE journal of solid-state circuits (01.01.2005)
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Journal Article
Conference Proceeding
A 500MHz multi-banked compilable DRAM macro with direct write and programmable pipelining
Barth, J., Anand, D., Dreibelbis, J., Fifield, J., Gorman, K., Nelms, M., Pomichter, G., Pontius, D.
Published in 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) (2004)
Published in 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) (2004)
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Conference Proceeding
BIST-based bitfail mapping of an embedded DRAM
Kessler, B.R., Dreibelbis, J., McMahon, T., McCloy, J.S., Kho, R.
Published in Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing (2001)
Published in Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing (2001)
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Conference Proceeding
Test and repair of large embedded DRAMs. 2
Nelson, E., Dreibelbis, J., McConnell, R.
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)
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Conference Proceeding
Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering
Barth, J. E., Dreibelbis, J. H., Nelson, E. A., Anand, D. L., Pomichter, G., Jakobsen, P., Nelms, M. R., Leach, J., Belansek, G. M.
Published in IBM journal of research and development (01.11.2002)
Published in IBM journal of research and development (01.11.2002)
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Journal Article
Variation in Brood Sex Ratios of Texas Rio Grande Wild Turkeys
COLLIER, BRET A, MELTON, KYLE B, DREIBELBIS, JUSTIN Z, KUVLESKY, WILLIAM P, PROUDFOOT, GLENN A, AGUIRRE, RAY, HEWITT, DAVID G, SCHWERTNER, T. W, DEMASO, STEPHEN J, SILVY, NOVA J, PETERSON, MARKUS J
Published in The Journal of wildlife management (01.08.2007)
Published in The Journal of wildlife management (01.08.2007)
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Journal Article
Embedded DRAM design and architecture for the IBM 0.11-(mu)m ASIC offering
Barth, J E, Dreibelbis, J H, Nelson, E A, Anand, D L
Published in IBM journal of research and development (01.11.2002)
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Published in IBM journal of research and development (01.11.2002)
Journal Article
A 1.0GHz multi-banked embedded DRAM in 65nm CMOS featuring concurrent refresh and hierarchical BIST
Anand, D., Covino, J., Dreibelbis, J., Fifield, J., Gorman, K., Jacunski, M., Paparelli, J., Pomichter, G., Pontius, D., Roberge, M., Sliva, S.
Published in 2007 IEEE Custom Integrated Circuits Conference (01.09.2007)
Published in 2007 IEEE Custom Integrated Circuits Conference (01.09.2007)
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Conference Proceeding
An ASIC library granular DRAM macro with built-in self test
Dreibelbis, J., Barth, J., Kho, R., Kalter, T.
Published in 1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156) (1998)
Published in 1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156) (1998)
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Conference Proceeding
Journal Article
A 300MHz multi-banked, eDRAM macro featuring GND sense, bit-line twisting and direct reference cell write
Barth, J., Anand, D., Dreibelbis, J., Nelson, E.
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)
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Conference Proceeding
A 300 MHz multi-banked eDRAM macro featuring GND sense, bit-line twisting and direct reference cell write
Barth, J., Anand, D., Dreibelbis, J., Nelson, E.
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)
Published in 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) (2002)
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Conference Proceeding
A High Performance 128k (32K x 4) NMOS RAM
Dreibelbis, J., Gabric, J., Roberts, A., Tong, M.
Published in 1984 Symposium on VLSI Technology. Digest of Technical Papers (01.09.1984)
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Published in 1984 Symposium on VLSI Technology. Digest of Technical Papers (01.09.1984)
Conference Proceeding
A 256K SRAM with on-chip power supply conversion
Roberts, A., Dreibelbis, J., Braceras, G., Gabric, J., Gilbert, L., Goodwin, R., Hedberg, E., Maffitt, T., Meuniar, L., Moran, D., Phuong Nguyen, Reed, D., Reismiller, D., Sasaki, R.
Published in 1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (1987)
Published in 1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (1987)
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Conference Proceeding
Gen interconnection: Lessons from New England
Doot, David T, Garwood, Steve, Dreibelbis, Debra J
Published in Public Utilities Fortnightly (15.09.2002)
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Published in Public Utilities Fortnightly (15.09.2002)
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