Applications of SIMS to cultural heritage studies
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Conference Proceeding
Sodium and hydrogen analysis of room temperature glass corrosion using low energy Cs SIMS
Fearn, S., McPhail, D.S., Morris, R.J.H., Dowsett, M.G.
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
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Conference Proceeding
Simultaneous in situ time resolved SR-XRD and corrosion potential analyses to monitor the corrosion on copper
Leyssens, K., Adriaens, A., Dowsett, M.G., Schotte, B., Oloff, I., Pantos, E., Bell, A.M.T., Thompson, S.P.
Published in Electrochemistry communications (01.12.2005)
Published in Electrochemistry communications (01.12.2005)
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Journal Article
The use of low-energy SIMS (LE-SIMS) for nanoscale fuel cell material development
Morris, R. J. H., Fearn, S., Perkins, J., Kilner, J., Dowsett, M. G., Beigalski, M. D., Rouleau, C. M.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
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Journal Article
Conference Proceeding
Sputter yields in diamond bombarded by ultra low energy ions
Guzmán de la Mata, B., Dowsett, M.G., Twitchen, D.
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
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Journal Article
Conference Proceeding
The use of ultra-low-energy dynamic SIMS in the study of the tarnishing of silver
Dowsett, M.G., Adriaens, A., Soares, M., Wouters, H., Palitsin, V.V.N., Gibbons, R., Morris, R.J.H.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.09.2005)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.09.2005)
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Journal Article
Calibration of boron concentration in CVD single crystal diamond combining ultralow energy secondary ions mass spectrometry and high resolution X-ray diffraction
Guzmán de la Mata, B., Sanz-Hervás, A., Dowsett, M.G., Schwitters, M., Twitchen, D.
Published in Diamond and related materials (01.04.2007)
Published in Diamond and related materials (01.04.2007)
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Journal Article
Conference Proceeding
Low energy SIMS characterisation of ultra thin oxides on ferrous alloys
Rees, E.E., McPhail, D.S., Ryan, M.P., Kelly, J., Dowsett, M.G.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
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Journal Article
uleSIMS characterization of silver reference surfaces
Palitsin, V.V., Dowsett, M.G., Mata, B. Guzmán de la, Oloff, I.W., Gibbons, R.
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
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Journal Article
Conference Proceeding
Quantitative analysis of the top 5 nm of boron ultra-shallow implants
Bellingham, J., Dowsett, M.G., Collart, E., Kirkwood, D.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
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Journal Article
On determining accurate positions, separations, and internal profiles for delta layers
Dowsett, M.G., Kelly, J.H., Rowlands, G., Ormsby, T.J., Guzmán, B., Augustus, P., Beanland, R.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
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Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si 1− xGe x alloy layers
Dowsett, M.G., Morris, R., Chou, Pei-Fen, Corcoran, S.F., Kheyrandish, H., Cooke, G.A., Maul, J.L., Patel, S.B.
Published in Applied surface science (2003)
Published in Applied surface science (2003)
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Journal Article
A floating low energy electron gun (FLEG) for charge compensation in SIMS and other applications
Gibbons, R., Dowsett, M.G., Kelly, J., Blenkinsopp, P., Hill, R., Richards, D., Loibl, N.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
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Journal Article
Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1−xGex alloy layers
Dowsett, M.G., Morris, R., Chou, Pei-Fen, Corcoran, S.F., Kheyrandish, H., Cooke, G.A., Maul, J.L., Patel, S.B.
Published in Applied surface science (15.01.2003)
Published in Applied surface science (15.01.2003)
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