Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias
Wei Feng, Chun Meng Dou, Niwa, Masaaki, Yamada, Keisaku, Ohmori, Kenji
Published in IEEE electron device letters (01.01.2014)
Published in IEEE electron device letters (01.01.2014)
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Journal Article
Nonvolatile Circuits-Devices Interaction for Memory, Logic and Artificial Intelligence
Dou, Chun-Meng, Chen, Wei-Hao, Xue, Cheng-Xin, Lin, Wei-Yu, Lin, Wei-En, Li, Jun-Yi, Lin, Huan-Ting, Chang, Meng-fan
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)
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Conference Proceeding
Characterization of interface state density of three-dimensional Si nanostructure by charge pumping measurement
Dou, Chunmeng, Shoji, Tomoya, Nakajima, Kazuhiro, Kakushima, Kuniyuki, Ahmet, Parhat, Kataoka, Yoshinori, Nishiyama, Akira, Sugii, Nobuyuki, Wakabayashi, Hitoshi, Tsutsui, Kazuo, Natori, Kenji, Iwai, Hiroshi
Published in Microelectronics and reliability (01.04.2014)
Published in Microelectronics and reliability (01.04.2014)
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Journal Article