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Safronov, I.V., Shymanski, V.I., Uglov, V.V., Kvasov, N.T., Dorozhkin, N.N.
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Published in Computational materials science (01.10.2016)
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New semiconducting silicide Ca3Si4
Migas, D B, Shaposhnikov, V L, Filonov, A B, Dorozhkin, N N, Borisenko, V E
Published in Journal of physics. Condensed matter (29.08.2007)
Published in Journal of physics. Condensed matter (29.08.2007)
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Electronic and related properties of crystalline semiconducting iron disilicide
Filonov, A. B., Migas, D. B., Shaposhnikov, V. L., Dorozhkin, N. N., Petrov, G. V., Borisenko, V. E., Henrion, W., Lange, H.
Published in Journal of applied physics (15.05.1996)
Published in Journal of applied physics (15.05.1996)
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Electronic and optical properties of Ir3Si5
Migas, D. B., Shaposhnikov, V. L., Rodin, V. N., Dorozhkin, N. N., Borisenko, V. E.
Published in Physica Status Solidi (b) (01.09.2007)
Published in Physica Status Solidi (b) (01.09.2007)
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Polarization Changes during a Lightning Strike: Isotropic Zones of Anisotropic Optical Fiber
Gorbatov, D. V., Dorozhkin, A. N., Igumenov, A. Yu, Konyshev, V. A., Lukinykh, T. O., Nanii, O. E., Novikov, A. G., Treshchikov, V. N., Ubaydullaev, R. R.
Published in Bulletin of the Lebedev Physics Institute (01.08.2023)
Published in Bulletin of the Lebedev Physics Institute (01.08.2023)
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Multiple scattering calculations of Fe K EXAFS for Fe surfaces and nanocrystals
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Electronic properties of semiconducting rhenium silicide
Filonov, A. B, Migas, D. B, Shaposhnikov, V. L, Dorozhkin, N. N, Borisenko, V. E, Lange, H, Heinrich, A
Published in Europhysics letters (01.05.1999)
Published in Europhysics letters (01.05.1999)
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Simulation of defect formation, amorphization and cluster formation processes in nc-TiN/a-Si3N4 nanocomposite under Xe irradiation
Uglov, V.V., Safronov, I.V., Remnev, G.E., Saladukhin, I.A., Kvasov, N.T., Dorozhkin, N.N., Shymanski, V.I.
Published in Computational materials science (15.02.2018)
Published in Computational materials science (15.02.2018)
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NUMERICAL SIMULATION OF ELECTRIC CHARACTERISTICS OF DEEP SUBMICRON SILICON-ON-INSULATOR MOS TRANSISTOR
Borzdov, A. V., Borzdov, V. M., Dorozhkin, N. N.
Published in Pribory i metody izmererij (01.01.2016)
Published in Pribory i metody izmererij (01.01.2016)
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Chirp measurement with FM discriminator
Bazarov, T. O., Starykh, D. D., Dorozhkin, A. N., Nanii, O. E., Treshchikov, V. N.
Published in 2020 International Conference Laser Optics (ICLO) (02.11.2020)
Published in 2020 International Conference Laser Optics (ICLO) (02.11.2020)
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Conference Proceeding
Self-consistent band structure calculations for the compounds TiN, Ti0.75Zr0.25N, Ti0.25Zr0.75N, and ZrN by the linear method of augmented Slater orbitals
Yakutovich, N. G., Dorozhkin, N. N., Anishchik, V. M., Novysh, B. V.
Published in Physics of the solid state (01.01.2000)
Published in Physics of the solid state (01.01.2000)
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Symbol rate limitation due to optical filtering
Bazarov, T O, Senko, M A, Dorozhkin, A N, Starykh, D D, Nanii, O E, Treshchikov, V N
Published in Laser physics letters (01.07.2022)
Published in Laser physics letters (01.07.2022)
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