A fault simulation methodology for MEMS
Rosing, R., Richardson, A.M., Dorey, A.P.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) (2000)
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) (2000)
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Conference Proceeding
Testing analogue circuits by AC power supply voltage
A'ain, A.K.B., Bratt, A.H., Dorey, A.P.
Published in Proceedings of 9th International Conference on VLSI Design (1996)
Published in Proceedings of 9th International Conference on VLSI Design (1996)
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Conference Proceeding
On the development of power supply voltage control testing technique for analogue circuits
A'ain, A.K.B., Bratt, A.H., Dorey, A.P.
Published in Proceedings of the Fourth Asian Test Symposium (1995)
Published in Proceedings of the Fourth Asian Test Symposium (1995)
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Conference Proceeding
Reliability testing by precise electrical measurement
Dorey, A.P., Jones, B.K., Richardson, A.M., Russell, P.C., Xu, Y.Z.
Published in International Test Conference 1988 Proceeding@m_New Frontiers in Testing (1988)
Published in International Test Conference 1988 Proceeding@m_New Frontiers in Testing (1988)
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Conference Proceeding
Application specific integrated circuit implementation of SISO control-laws
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Conference Proceeding