by Pfeiffer, H.C., Dhaliwal, R.S., Golladay, S.D., Doran, S.K., Gordon, M.S., Kendall, R.A., Lieberman, J.E., Pinckney, D.J., Quickle, R.J., Robinson, C.F., Rockrohr, J.D., Stickel, W., Tressler, E.V., Tanimoto, A., Yamaguchi, T., Okamoto, K., Suzuki, K., Miura, T., Okino, T., Kawata, S., Morita, K., Suzuki, S.C., Shimizu, H., Kojima, S., Varnell, G., Novak, W.T., Sogard, M.
Published in Microelectronic engineering (01.09.2001)