Amorphous InGaZnO Thin-Film Transistors-Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range
KIM, Yongsik, BAE, Minkyung, KIM, Woojoon, KONG, Dongsik, HYUN KWANG JEONG, KIM, Hyungtak, CHOI, Sunwoong, DONG MYONG KIM, DAE HWAN KIM
Published in IEEE transactions on electron devices (01.10.2012)
Published in IEEE transactions on electron devices (01.10.2012)
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Journal Article
Amorphous InGaZnO Thin-Film Transistors-Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability
KIM, Yongsik, KIM, Sungchul, KIM, Woojoon, BAE, Minkyung, HYUN KWANG JEONG, KONG, Dongsik, CHOI, Sunwoong, DONG MYONG KIM, DAE HWAN KIM
Published in IEEE transactions on electron devices (01.10.2012)
Published in IEEE transactions on electron devices (01.10.2012)
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Journal Article
Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors
Kim, Sungchul, Jeon, Yong Woo, Kim, Yongsik, Kong, Dongsik, Jung, Hyun Kwang, Bae, Min-Kyung, Lee, Je-Hun, Ahn, Byung Du, Park, Sei Yong, Park, Jun-Hyun, Park, Jaewoo, Kwon, Hyuck-In, Kim, Dong Myong, Kim, Dae Hwan
Published in IEEE electron device letters (01.01.2012)
Published in IEEE electron device letters (01.01.2012)
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Journal Article
Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors
BAE, Minkyung, YUN, Daeyoun, KIM, Yongsik, KONG, Dongsik, KWANG JEONG, Hyun, KIM, Woojoon, KIM, Jaehyeong, HUR, Inseok, HWAN KIM, Dae, MYONG KIM, Dong
Published in IEEE electron device letters (01.03.2012)
Published in IEEE electron device letters (01.03.2012)
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Journal Article
Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density
Bae, Minkyung, Kim, Yongsik, Kong, Dongsik, Jeong, Hyun Kwang, Kim, Woojoon, Kim, Jaehyeong, Hur, Inseok, Kim, Dong Myong, Kim, Dae Hwan
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
Endurance Characteristics of Amorphous-InGaZnO Transparent Flash Memory With Gold Nanocrystal Storage Layer
Jaeman Jang, Jae Chul Park, Dongsik Kong, Kim, D. M., Jang-Sik Lee, Byeong-Hyeok Sohn, Il Hwan Cho, Dae Hwan Kim
Published in IEEE transactions on electron devices (01.11.2011)
Published in IEEE transactions on electron devices (01.11.2011)
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Journal Article
Extraction of Separated Source and Drain Resistances in Amorphous Indium-Gallium-Zinc Oxide TFTs Through C- V Characterization
BAE, Hagyoul, KIM, Sungchul, BAE, Minkyung, JA SUN SHIN, KONG, Dongsik, JUNG, Hyunkwang, JANG, Jaeman, LEE, Jieun, DAE HWAN KIM, DONG MYONG KIM
Published in IEEE electron device letters (01.06.2011)
Published in IEEE electron device letters (01.06.2011)
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Journal Article
The Effect of the Active Layer Thickness on the Negative Bias Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors
Kong, Dongsik, Jung, Hyun-Kwang, Kim, Yongsik, Bae, Minkyung, Jeon, Yong Woo, Kim, Sungchul, Kim, Dong Myong, Kim, Dae Hwan
Published in IEEE electron device letters (01.10.2011)
Published in IEEE electron device letters (01.10.2011)
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Journal Article
AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter
Kim, Dae-Hwan, Kong, Dongsik, Kim, Sungchul, Jeon, Young Woo, Kim, Yongsik, Kim, Dong Myong, Kwon, Hyuck-In
Published in Japanese Journal of Applied Physics (01.09.2011)
Published in Japanese Journal of Applied Physics (01.09.2011)
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Journal Article
AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter
Kim, Dae-Hwan, Kong, Dongsik, Kim, Sungchul, Jeon, Young Woo, Kim, Yongsik, Kim, Dong Myong, Kwon, Hyuck-In
Published in Japanese Journal of Applied Physics (01.09.2011)
Published in Japanese Journal of Applied Physics (01.09.2011)
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Journal Article
Physics-Based SPICE Model of a-InGaZnO Thin-Film Transistor Using Verilog-A
Jeon, Yong-Woo, Hur, In-Seok, Kim, Yong-Sik, Bae, Min-Kyung, Jung, Hyun-Kwang, Kong, Dong-Sik, Kim, Woo-Joon, Kim, Jae-Hyeong, Jang, Jae-Man, Kim, Dong-Myong, Kim, Dae-Hwan
Published in Journal of semiconductor technology and science (30.09.2011)
Published in Journal of semiconductor technology and science (30.09.2011)
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Journal Article
Comparative study of quasi-static and normal capacitance–voltage characteristics in amorphous Indium-Gallium-Zinc-Oxide thin film transistors
Lee, Sangwon, Jeon, Yong Woo, Kim, Sungchul, Kong, Dongsik, Kim, Dae Hwan, Kim, Dong Myong
Published in Solid-state electronics (01.02.2011)
Published in Solid-state electronics (01.02.2011)
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Journal Article
Extraction of Separated Source and Drain Resistances in Amorphous Indium-Gallium-Zinc Oxide TFTs Through [Formula Omitted]- [Formula Omitted] Characterization
Bae, Hagyoul, Kim, Sungchul, Bae, Minkyung, Shin, Ja Sun, Kong, Dongsik, Jung, Hyunkwang, Jang, Jaeman, Lee, Jieun, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.06.2011)
Published in IEEE electron device letters (01.06.2011)
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Journal Article
INTEGRATED CIRCUIT DEVICES AND METHODS OF FORMING THE SAME
LEE, Hyunjung, LEE, Junbum, LEE, Jinseong, KIM, Junsoo, KONG, Dongsik
Year of Publication 26.06.2024
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Year of Publication 26.06.2024
Patent
INTEGRATED CIRCUIT DEVICES AND METHODS OF FORMING THE SAME
Kong, Dongsik, Kim, Junsoo, Lee, Junbum, Lee, Hyunjung, Lee, Jinseong
Year of Publication 20.06.2024
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Year of Publication 20.06.2024
Patent
SEMICONDUCTOR MEMORY DEVICE
CHOI, Hyun Seung, LEE, Jun-Bum, KWON, Jihye, KIM, Junsoo, CHOI, Jae Hyun, KONG, Dongsik
Year of Publication 10.10.2024
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Year of Publication 10.10.2024
Patent
SEMICONDUCTOR MEMORY DEVICE
KIM, JUNSOO, KONG, DONGSIK, KWON, JIHYE, CHOI, JAE HYUN, AN, TAEYOON, CHOI, Hyun Seung, LEE, JUN-BUM
Year of Publication 19.09.2024
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Year of Publication 19.09.2024
Patent
SEMICONDUCTOR MEMORY DEVICE
CHOI, Hyun Seung, LEE, Jun-Bum, KWON, Jihye, KIM, Junsoo, CHOI, Jae Hyun, AN, Taeyoon, KONG, Dongsik
Year of Publication 18.09.2024
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Year of Publication 18.09.2024
Patent