Investigation of Fixed Oxide Charge and Fin Profile Effects on Bulk FinFET Device Characteristics
Bomsoo Kim, Dong-Il Bae, Zeitzoff, Peter, Xin Sun, Standaert, Theodorus E., Tripathi, Neeraj, Scholze, Andreas, Oldiges, Philip J., Dechao Guo, Huiling Shang, Kang-Ill Seo
Published in IEEE electron device letters (01.12.2013)
Published in IEEE electron device letters (01.12.2013)
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Journal Article
A Nanowire Transistor for High Performance Logic and Terabit Non-Volatile Memory Devices
Lee, Hyunjin, Kim, Ju-Hyun, Bae, Dong-il, Jeon, Sang Cheol, Kim, Kwang Hee, Lee, Gi Sung, Oh, Jae Sub, Park, Yun Chang, Bae, Woo Ho, Yoo, Jung Jae, Yang, Jun Mo, Ryu, Seong-Wan, Lee, Hee Mok, Choi, Yang-Kyu, Han, Jin-Woo, Yu, Lee-Eun, Im, Maesoon, Kim, Chungjin, Kim, Sungho, Lee, Eujune, Kim, Kuk-Hwan
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
A new approach to cell size scaling with a multi-dual cell and a buffer/background programming of unified RAM
Bae, Dong-Il, Ryu, Seong-Wan, Gu, Bonsang, Choi, Yang-Kyu
Published in Microelectronic engineering (01.02.2010)
Published in Microelectronic engineering (01.02.2010)
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Journal Article
A novel tensile Si (n) and compressive SiGe (p) dual-channel CMOS FinFET co-integration scheme for 5nm logic applications and beyond
Bae, Dong-il, Bae, Geumjong, Bhuwalka, Krishna K, Lee, Seung-Hun, Song, Myung-Geun, Jeon, Taek-soo, Kim, Cheol, Kim, Wookje, Park, Jaeyoung, Kim, Sunjung, Kwon, Uihui, Jeon, Jongwook, Nam, Kab-Jin, Lee, Sangwoo, Lian, Sean, Seo, Kang-ill, Lee, Sun-Ghil, Jae Hoo Park, Heo, Yeon-Cheol, Rodder, Mark S., Kittl, Jorge A., Kim, Yihwan, Hwang, Kihyun, Kim, Dong-Won, Liang, Mong-song, Jung, E.S.
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
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Conference Proceeding
Acceptor-like trap effect on negative-bias temperature instability (NBTI) of SiGe pMOSFETs on SRB
Guangfan Jiao, Toledano-Luque, Maria, Kab-Jin Nam, Toshiro, Nakanishi, Seung-Hun Lee, Jin-Soak Kim, Kauerauf, Thomas, EunAe Chung, Dong-il Bae, Geumjong Bae, Dong-Won Kim, Kihyun Hwang
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
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Conference Proceeding
Multiple data storage of URAM (Unified-RAM) with multi dual cell (MDC) method
Dong-il Bae, Bonsang Gu, Seong-wan Ryu, Yang-Kyu Choi
Published in 2008 IEEE Silicon Nanoelectronics Workshop (01.06.2008)
Published in 2008 IEEE Silicon Nanoelectronics Workshop (01.06.2008)
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Conference Proceeding
SEMICONDUCTOR DEVICE
SONG, HYUN-SEUNG, PARK, NOH YEONG, PARK, BEOMJIN, BAE, DONG IL, BAEK, Sangwon
Year of Publication 11.07.2024
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Year of Publication 11.07.2024
Patent