by Han Wang, Hsu, Allen, Dong Seup Lee, Ki Kang Kim, Jing Kong, Palacios, Tomas
Published in IEEE electron device letters (01.03.2012)

by Dong Seup Lee, Xiang Gao, Shiping Guo, Kopp, D., Fay, P., Palacios, T.
Published in IEEE electron device letters (01.11.2011)

by Lee, Ethan S., Joh, Jungwoo, Lee, Dong Seup, del Alamo, Jesús A.
Published in Applied physics letters (21.02.2022)

by Lee, Dong Seup, Liu, Zhihong, Palacios, Tomás
Published in Japanese Journal of Applied Physics (01.10.2014)

by Dong Seup Lee, Xiang Gao, Shiping Guo, Palacios, T
Published in IEEE electron device letters (01.05.2011)

by Hyung-Seok Lee, Dong Seup Lee, Palacios, T
Published in IEEE electron device letters (01.05.2011)

by Bahl, Sandeep R., Ruiz, Daniel, Dong Seup Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)

by Dong Seup Lee, Chung, Jinwook W, Han Wang, Xiang Gao, Shiping Guo, Fay, Patrick, Palacios, Tomás
Published in IEEE electron device letters (01.06.2011)

by DONG SEUP LEE, HAN WANG, SAUNIER, Paul, PALACIOS, Tomás, ALLEN HSU, AZIZE, Mohamed, LABOUTIN, Oleg, YU CAO, JOHNSON, Jerry Wayne, BEAM, Edward, KETTERSON, Andrew, SCHUETTE, Michael L
Published in IEEE electron device letters (21.06.2013)

by DONG SEUP LEE, LABOUTIN, Oleg, YU CAO, JOHNSON, Wayne, BEAM, Edward, KETTERSON, Andrew, SAUNIER, Paul, PALACIOS, Tomás
Published in IEEE electron device letters (01.07.2012)

by Lee, Dong Seup, Laboutin, Oleg, Cao, Yu, Johnson, Jerry Wayne, Beam, Edward, Ketterson, Andrew, Schuette, Michael L., Saunier, Paul, Palacios, Tomas
Published in IEEE electron device letters (01.07.2013)

by Radhakrishna, Ujwal, Lan Wei, Dong-Seup Lee, Palacios, T., Antoniadis, D.
Published in 2012 International Electron Devices Meeting (01.12.2012)

by Dong Seup Lee, Laboutin, O., Yu Cao, Johnson, W., Beam, E., Ketterson, A., Schuette, M., Saunier, P., Palacios, T.
Published in IEEE electron device letters (01.07.2012)

by Dong Seup Lee, Han Wang, Hsu, Allen, Azize, Mohamed, Laboutin, Oleg, Yu Cao, Johnson, Wayne, Beam, Edward, Ketterson, Andrew, Schuette, Michael, Saunier, Paul, Palacios, Tomas
Published in 71st Device Research Conference (01.06.2013)

by DONG SEUP LEE, KANG, Sangwoo, KANG, Kwon-Chil, LEE, Joung-Eob, JUNG HOON LEE, SONG, Kwan-Jae, DONG MYONG KIM, JONG DUK LEE, PARK, Byung-Gook
Published in IEEE transactions on nanotechnology (01.07.2009)

by Lee, Dong Seup, Yang, Hong-Seon, Kang, Kwon-Chil, Lee, Joung-Eob, Lee, Jung Han, Park, Sang Hyuk, Park, Byung-Gook
Published in Japanese Journal of Applied Physics (01.07.2009)

by Lee, Dong Seup, Wang, Han, Hsu, Allen, Azize, Mohamed, Laboutin, Oleg, Cao, Yu, Johnson, Jerry Wayne, Beam, Edward, Ketterson, Andrew, Schuette, Michael L., Saunier, Paul, Palacios, Tomas
Published in IEEE electron device letters (01.08.2013)

by Lee, Ethan S., Joh, Jungwoo, Lee, Dong Seup, del Alamo, Jesus A.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Sanghoon Lee, Heung-Jae Cho, Younghwan Son, Dong Seup Lee, Hyungcheol Shin
Published in 2009 IEEE International Electron Devices Meeting (IEDM) (01.12.2009)

by Lee, Dong Seup, Varghese, Dhanoop, Sonnet, Arif, Joh, Jungwoo, Venugopal, Archana, Krishnan, Srikanth
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)