Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-corrected Electron Microscope with 0.5 ? Information Limit
Kisielowski, Christian, Bischoff, Maarten, van Lin, Hans, Lazar, Sorin, Freitag, Bernhard, Knippels, Georg, Tiemeijer, Peter, van der Stam, Maarten, von Harrach, Sebastian, Stekelenburg, Michael, Haider, Maximilian, M ller, Hans, Hartel, Peter, Kabius, Bernd, Miller, Dean, Petrov, Ivan, Olson, Eric, Donchev, Tomas, Kenik, Edward A, Lupini, Andrew R, Bentley, James, Pennycook, Stephen J, Minor, Andrew, Schmid, Andreas, Duden, Thomas, Radmilovic, Velimir, Ramasse, Quentin, Watanabe, Masashi, Stach, Eric, Denes, Peter, Dahmen, Ulrich
Published in Microscopy and microanalysis (01.01.2008)
Published in Microscopy and microanalysis (01.01.2008)
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