Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance
Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E.
Published in IEEE transactions on nuclear science (01.06.2013)
Published in IEEE transactions on nuclear science (01.06.2013)
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Journal Article
Conference Proceeding
Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects
Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E.
Published in IEEE transactions on nuclear science (01.06.2013)
Published in IEEE transactions on nuclear science (01.06.2013)
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Journal Article
Conference Proceeding
Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing
Shaneyfelt, M.R., Felix, J.A., Dodd, P.E., Schwank, J.R., Dalton, S.M., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Blackmore, E.W.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Radiation-induced charge trapping in thin Al2O3/SiOxNy/Si(100) gate dielectric stacks
Felix, J.A, Shaneyfelt, M.R, Fleetwood, D.M, Meisenheimer, T.L, Schwank, J.R, Schrimpf, R.D, Dodd, P.E, Gusev, E.P, D'Emic, C
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
Dodds, Nathaniel Anson, Schwank, James Ralph, Shaneyfelt, Marty R, Dodd, Paul Emerson, Doyle, Barney Lee, Trinczek, M. C., Blackmore, Ewart W., Rodbell, Kenneth P., Reed, R. A., Pellish, Jonathan A., LaBel, Kenneth A., Marshall, P. W., Swanson, Scot E., Vizkelethy, Gyorgy, Van Deusen, Stuart B.
Year of Publication 01.05.2014
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Year of Publication 01.05.2014
Conference Proceeding
Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging
Schwank, J.R., Shaneyfelt, M.R., Dasgupta, A., Francis, S.A., Zhou, X.J., Fleetwood, D.M., Schrimpf, R.D., Pantelides, S.T., Felix, J.A., Dodd, P.E., Ferlet-Cavrois, V., Paillet, P., Dalton, S.M., Swanson, S.E., Hash, G.L., Thornberg, S.M., Hochrein, J.M., Lum, G.K.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices
Shaneyfelt, M.R., Pease, R.L., Maher, M.C., Schwank, J.R., Gupta, S., Dodd, P.E., Riewe, L.C.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
3D simulation of heavy-ion induced charge collection in SiGe HBTs
Niu, Guofu, Marshall, Paul W., Reed, Robert A., Cressler, John D., Joseph, Alvin J., Krithivasan, Ramkumar, Varadharajaperumal, Muthubalan, Dodd, Paul Emerson, Vizkelethy, Gyorgy
Published in IEEE transactions on nuclear science (01.08.2003)
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Published in IEEE transactions on nuclear science (01.08.2003)
Journal Article
Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20 um SiGe heterojunction bipolar transistors and circuits
Fritz, Karl, Irwin, Timothy J., Niu, Guofu, Fodness, Bryan, Carts, Martin A., Marshall, Paul W., Reed, Robert A., Gilbert, Barry, Randall, Barbara, Prairie, Jason, Riggs, Pam, Pickel, James C., LaBel, Kenneth, Cressler, John D., Krithivasan, Ramkumar, Dodd, Paul Emerson, Vizkelethy, Gyorgy
Published in IEEE transactions on nuclear science (01.09.2003)
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Published in IEEE transactions on nuclear science (01.09.2003)
Journal Article