by Bossuet, A., Divay, A., Martineau, B., Dehos, C., Blampey, B., Morandini, Y.
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)

by Divay, A., Dehos, C., Charlet, I., Gaillard, F., Duriez, B., Garros, X., Antonijevic, J., Hai, J., Revil, N., Forest, J., Knopik, V., Cacho, F., Roy, D., Federspiel, X., Cremer, S., Chevalier, P.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)

by Hai, J., Cacho, F., Federspiel, X., Garba-Seybou, T., Divay, A., Lauga-Larroze, E., Arnould, J.-D.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Hai, J., Cacho, F., Divay, A., Lauga-Larroze, E., Arnould, J.-D., Forest, J., Knopik, V., Garros, X.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Divay, A., Latry, O., Duperrier, C., Temcamani, F.
Published in Journal of semiconductors (2016)

by Martineau, B., Bossuet, A., Divay, A., Blampey, B., Morandini, Y.
Published in 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (24.10.2022)

by Divay, A., Forest, J., Knopik, V., Hai, J., Revil, N., Antonijevic, J., Michard, A., Cacho, F., Vincent, E., Gaillard, F., Garros, X.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)

by Morvan, E., Gobil, Y., Morisot, F., Biscarat, J., Charles, M., Lugo, J., Divay, A., Medbouhi, M., Charlet, I., Delprato, J., Scheiblin, P., Rrustemi, B., Giry, A., Serhan, A., Ruel, S., Pimenta-Barros, P., Laulagnet, F., Minoret, S., Anotta, A., Billon, T., Duriez, B.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Garros, X., Cacho, F., Vincent, E., Granger, E., Gaillard, F., Knopik, V., Revil, N., Divay, A., Cluzel, J., Lugo, J., Giry, A., Federspiel, X., Bertrand, G.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Ong, S. N., Lehmann, S., Chow, W. H., Zhang, C., Schippel, C., Chan, L. H. K., Andee, Y., Hauschildt, M., Tan, K. K. S., Watts, J., Lim, C. K., Divay, A., Wong, J. S., Zhao, Z., Govindarajan, M., Schwan, C., Huschka, A., Bcllaouar, A., Loo, W., Mazurier, J., Grass, C., Taylor, R., Chew, K. W. J., Embabi, S., Workman, G., Pakfar, A., Morvan, S., Sundaram, K., Lau, M. T., Rice, B., Harame, D.
Published in 2018 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) (01.06.2018)

by Divay, A., Masmoudi, M., Latry, O., Duperrier, C., Temcamani, F.
Published in Microelectronics and reliability (01.08.2015)

by Divay, A., Valorge, O., Dubarry, C., Medbouhi, M., Franiatte, R., Mermin, D., Velard, R., Gobil, Y., Morisot, F., Morvan, E., Charlet, I., Lucci, L., Lugo, J., Garros, X.
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)

by Divay, A., Duperrier, C., Temcamani, F., Latry, O.
Published in Microelectronics and reliability (01.09.2016)

by Latry, O., Divay, A., Fadil, D., Dherbécourt, P.
Published in Journal of semiconductors (01.01.2017)

by Divay, A, Masmoudi, Mohamed Lamine, Latry, Olivier, Duperrier, C, Temcamani, Farid
Published in Microelectronics and reliability (01.09.2015)

by Latry, O., Divay, A., Fadil, D., Dherbécourt, P.
Published in Journal of semiconductors (01.01.2017)

by Aydin, Ömür Işıl, Holt, Judson Robert, Le Royer, Cyrille, Vanamurthy, Laks, Feudel, Thomas, Heyne, Tobias, Gerber, Ralf, Lenski, Markus, Jansen, Sören, Utess, Dirk, Klein, Christoph, Peeva, Anita, Mulfinger, George Robert, McArdle, Timothy J, Barge, David, Divay, Alexis, Lehmann, Steffen, Smith, Elliot, Peters, Carsten, Sachse, Jens-Uwe
Published in ECS transactions (20.07.2018)

by Garros, X., Divay, A., Lacord, J., Serhan, A., Fache, T., Antonijevic, J., Cremer, S., Knopik, V., Giry, A., Charlet, I., Chouk, R., Royet, A-S., Forest, J., Revil, N., Cathelin, P., Chevalier, P., Roy, D., Gaillard, F., Duriez, B.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Schippel, C., Lehmann, S., Ong, S.N., Muehlhoff, A., Cortes, I., Chow, W.H., Utess, D., Zaka, A., Divay, A., Pakfar, A., Faul, J., Mazurier, J., Chew, K.W., Chan, L.H.K., Taylor, R., Rice, B., Harame, D.
Published in 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2018)

by Divay, A, Morin, J, Rouault, A, Toussaint, P
Published in Revue de l'infirmière (01.02.1985)