BEOL Process Effects on ePCM Reliability
Redaelli, A., Gandolfo, A., Samanni, G., Gomiero, E., Petroni, E., Scotti, L., Lippiello, A., Mattavelli, P., Jasse, J., Codegoni, D., Serafini, A., Ranica, R., Boccaccio, C., Sandrini, J., Berthelon, R., Grenier, J.-C., Weber, O., Turgis, D., Valery, A., Medico, S. Del, Caubet, V., Reynard, J.-P., Dutartre, D., Favennec, L., Conte, A., Disegni, F., De Tomasi, M., Ventre, A., Baldo, M., Ielmini, D., Maurelli, A., Ferreira, P., Arnaud, F., Piazza, F., Cappelletti, P., Annunziata, R., Gonella, R.
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
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Journal Article
ASIL-D automotive-grade microcontroller in 28nm FD-SOI with full-OTA capable 21MB embedded PCM memory and highly scalable power management
Grossier, N., Disegni, F., Ventre, A., Barcella, A., Mariani, R., Marino, V., Mazzara, S., Scavuzzo, A., Bansal, M., Soni, B., Anand, A., Banzal, S., Joshi, D., Narwal, R., Niranjani, M., Trivedi, K., Ferreira, P., Ranica, R., Vullo, L., Cathelin, A., Maurelli, A., Pezzini, S., Peri, M.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
Improving Ge-rich GST ePCM reliability through BEOL engineering
Redaelli, A., Gandolfo, A., Samanni, G., Gomiero, E., Petroni, E., Scotti, L., Lippiello, A., Mattavelli, P., Jasse, J., Codegoni, D., Serafini, A., Ranica, R., Boccaccio, C., Sandrini, J., Berthelon, R., Grenier, JC, Weber, O., Turgis, D., Valery, A., Del Medico, S., Caubet, V., Reynard, JP, Dutartre, D., Favennec, L., Conte, A., Disegni, F., De Tomasi, M., Ventre, A., Baldo, M., Ielmini, D., Maurelli, A., Ferreira, P., Arnaud, F., Piazza, F., Cappelletti, P., Annunziata, R., Gonella, R.
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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Conference Proceeding
2-Mb Embedded Phase Change Memory With 16-ns Read Access Time and 5-Mb/s Write Throughput in 90-nm BCD Technology for Automotive Applications
Carissimi, M., Mukherjee, R., Tyagi, V., Disegni, F., Manfre, D., Torti, C., Gallinari, D., Rossi, S., Gambero, A., Brambilla, D., Zuliani, P., Zurla, R., Cabrini, A., Torelli, G., Pasotti, M., Auricchio, C., Calvetti, E., Capecchi, L., Croce, L., Zanchi, S., Rana, V., Mishra, P.
Published in IEEE solid-state circuits letters (01.09.2019)
Published in IEEE solid-state circuits letters (01.09.2019)
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Journal Article
2-Mb Embedded Phase Change Memory With 16-ns Read Access Time and 5-Mb/s Write Throughput in 90-nm BCD Technology for Automotive Applications
Carissimi, M., Zurla, R., Auricchio, C., Calvetti, E., Capecchi, L., Croce, L., Zanchi, S., Rana, V., Mishra, P., Mukherjee, R., Tyagi, V., Disegni, F., Manfre, D., Torti, C., Gallinari, D., Rossi, S., Gambero, A., Brambilla, D., Zuliani, P., Cabrini, A., Torelli, G., Pasotti, M.
Published in ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC) (01.09.2019)
Published in ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC) (01.09.2019)
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Conference Proceeding
High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
Arnaud, F., Ferreira, P., Piazza, F., Gandolfo, A., Zuliani, P., Mattavelli, P., Gomiero, E., Samanni, G., Jasse, J., Jahan, C., Reynard, J. P., Berthelon, R., Weber, O., Villaret, A., Dumont, B., Grenier, J. C., Ranica, R., Gallon, C., Boccaccio, C., Souhaite, A., Desvoivres, L., Ristoiu, D., Favennec, L., Caubet, V., Delmedico, S., Cherault, N., Beneyton, R., Chouteau, S., Sassoulas, P. O., Clement, L., Boivin, P., Turgis, D., Disegni, F., Ogier, J. L., Federspiel, X., Kermarrec, O., Molgg, M., Viscuso, A., Annunziata, R., Maurelli, A., Cappelletti, P., Ciantar, E.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications
Carissimi, M., Auricchio, C., Calvetti, E., Capecchi, L., Torres, M., Zanchi, S., Gupta, P., Zurla, R., Cabrini, A., Gallinari, D., Disegni, F., Borghi, M., Palumbo, E., Redaelli, A., Pasotti, M.
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
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Conference Proceeding
Heater system optimization for robust ePCM reliability and scalability in 28nm FDSOI technology
Ranica, R., Berthelon, R., Gandolfo, A., Samanni, G., Gomiero, E., Jasse, J., Mattavelli, P., Sandrini, J., Querre, M., Le-Friec, Y., Poulet, J., Caubet, V., Favennec, L., Boccaccio, C., Ghezzi, G., Gallon, C., Grenier, JC, Dumont, B., Weber, O., Villaret, A., Beneyton, R., Cherault, N., Ristoiu, D., Del Medico, S., Kermarrec, O., Reynard, JP, Boivin, P., Souhaite, A., Desvoivres, L., Chouteau, S., Sassoulas, PO, Clement, L., Valery, A., Petroni, E., Turgis, D., Lippiello, A., Scotti, L., Disegni, F., Ventre, A., Ornaghi, D., De Tomasi, M., Maurelli, A., Conte, A., Arnaud, F., Redaelli, A., Annunziata, R., Cappelletti, P., Piazza, F., Ferreira, P., Gonella, R., Ciantar, E.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
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Conference Proceeding
A New BJT Selector for sub-0.02µm2 High Density Embedded PCM Memory in FDSOI CMOS Technology
Weber, O., Pigot, C., Berthelon, R., Gandolfo, A., Mattavelli, P., Jasse, J., Samanni, G., Gomiero, E., Richard, E., Grenier, J. C., Ranica, R., Chouteau, S., Beneyton, R., Duclaux, B., Beylier, C., Pelissier, D., Gallon, C., Toulouse, C., Jenny, C., Croisy, M., Borowiak, C., Haendler, S., Ogier, J.L., Batail, E., Gilibert, F., Boivin, P., Turgis, D., Conte, A., Disegni, F., Redaelli, A., Annunziata, R., Cappelletti, P., Piazza, F., Ferreira, P., Arnaud, F.
Published in 2021 Symposium on VLSI Technology (13.06.2021)
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Published in 2021 Symposium on VLSI Technology (13.06.2021)
Conference Proceeding
High Temperature Challenge for PCM as enabler for a wide applications spectrum
Zuliani, P., Disegni, F., Croce, L., Annunziata, R.
Published in 2019 IEEE 11th International Memory Workshop (IMW) (01.05.2019)
Published in 2019 IEEE 11th International Memory Workshop (IMW) (01.05.2019)
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Conference Proceeding
Truly Innovative 28nm FDSOI Technology for Automotive Micro-Controller Applications embedding 16MB Phase Change Memory
Arnaud, F., Zuliani, P., Reynard, J.P., Gandolfo, A., Disegni, F., Mattavelli, P., Gomiero, E., Samanni, G., Jahan, C., Berthelon, R., Weber, O., Richard, E., Barral, V., Villaret, A., Kohler, S., Grenier, J.C., Ranica, R., Gallon, C., Souhaite, A., Ristoiu, D., Favennec, L., Caubet, V., Delmedico, S., Cherault, N., Beneyton, R., Chouteau, S., Sassoulas, P.O., Vernhet, A., Le Friec, Y., Domengie, F., Scotti, L., Pacelli, D., Ogier, J.L., Boucard, F., Lagrasta, S., Benoit, D., Clement, L., Boivin, P., Ferreira, P., Annunziata, R., Cappelletti, P.
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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Conference Proceeding
Embedded PCM macro for automotive-grade microcontroller in 28nm FD-SOI
Disegni, F., Annunziata, R., Molgora, A., Campardo, G., Cappelletti, P., Zuliani, P., Ferreira, P., Ventre, A., Castagna, G., Cathelin, A., Gandolfo, A., Goller, F., Malhi, S., Manfre, D., Maurelli, A., Torti, C., Arnaud, F., Carfi, M., Perroni, M., Caruso, M., Pezzini, S., Piazza, G., Weber, O., Peri, M.
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
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Conference Proceeding
16MB High Density Embedded PCM macrocell for automotive-grade microcontroller in 28nm FD-SOI, featuring extension to 24MB for Over-The-Air software update
Disegni, F., Ventre, A., Molgora, A., Cappelletti, P., Badalamenti, R., Ferreira, P., Castagna, G., Cathelin, A., Gandolfo, A., Redaelli, A., Manfre, D., Maurelli, A., Torti, C., Piazza, F., Carfi, M., Arnaud, F., Perroni, M., Caruso, M., Pezzini, S., Annunziata, R., Piazza, G., Weber, O., Peri, M.
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
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Conference Proceeding