Compact Capacitance Model of Undoped or Lightly Doped Ultra-Scaled Triple-Gate FinFETs
Fasarakis, N., Tsormpatzoglou, A., Tassis, D. H., Pappas, I., Papathanasiou, K., Bucher, M., Ghibaudo, G., Dimitriadis, C. A.
Published in IEEE transactions on electron devices (01.12.2012)
Published in IEEE transactions on electron devices (01.12.2012)
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Journal Article
Origin of Low-Frequency Noise in the Low Drain Current Range of Bottom-Gate Amorphous IGZO Thin-Film Transistors
Theodorou, C. G., Tsormpatzoglou, A., Dimitriadis, C. A., Khan, S. A., Hatalis, M. K., Jomaah, J., Ghibaudo, G.
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
A New Analog Buffer Using Low-Temperature Polysilicon Thin-Film Transistors for Active-Matrix Displays
Pappas, I., Siskos, S., Dimitriadis, C.A.
Published in IEEE transactions on electron devices (01.02.2007)
Published in IEEE transactions on electron devices (01.02.2007)
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Journal Article
Analytical Drain Current Compact Model in the Depletion Operation Region of Short-Channel Triple-Gate Junctionless Transistors
Oproglidis, Theodoros A., Tsormpatzoglou, Andreas, Tassis, Dimitrios H., Karatsori, Theano A., Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.01.2017)
Published in IEEE transactions on electron devices (01.01.2017)
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Journal Article
Impact of Hot Carrier Aging on the Performance of Triple-Gate Junctionless MOSFETs
Oproglidis, Theodoros A., Karatsori, Theano A., Theodorou, Christoforos G., Tsormpatzoglou, Andreas, Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.02.2020)
Published in IEEE transactions on electron devices (01.02.2020)
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Journal Article
All Operation Region Characterization and Modeling of Drain and Gate Current Mismatch in 14-nm Fully Depleted SOI MOSFETs
Karatsori, Theano A., Theodorou, Christoforos G., Josse, Emmanuel, Dimitriadis, Charalabos A., Ghibaudo, G.
Published in IEEE transactions on electron devices (01.05.2017)
Published in IEEE transactions on electron devices (01.05.2017)
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Journal Article
Low-Frequency Noise Sources in Advanced UTBB FD-SOI MOSFETs
Theodorou, Christoforos G., Ioannidis, Eleftherios G., Andrieu, Francois, Poiroux, Thierry, Faynot, Olivier, Dimitriadis, Charalabos A., Ghibaudo, Gerard
Published in IEEE transactions on electron devices (01.04.2014)
Published in IEEE transactions on electron devices (01.04.2014)
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Journal Article
Origin of Low-Frequency Noise in Triple-Gate Junctionless n-MOSFETs
Oproglidis, Theodoros A., Karatsori, Theano A., Theodorou, Christoforos G., Tassis, Dimitrios, Barraud, Sylvain, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.12.2018)
Published in IEEE transactions on electron devices (01.12.2018)
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Journal Article
Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements
Hatzopoulos, A.T., Arpatzanis, N., Tassis, D.H., Dimitriadis, C.A., Oudwan, M., Templier, F., Kamarinos, G.
Published in IEEE transactions on electron devices (01.05.2007)
Published in IEEE transactions on electron devices (01.05.2007)
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Journal Article
Drain-Current Flicker Noise Modeling in nMOSFETs From a 14-nm FDSOI Technology
Ioannidis, Eleftherios G., Theodorou, Christoforos G., Karatsori, Theano A., Haendler, Sebastien, Dimitriadis, Charalabos A., Ghibaudo, Gerard
Published in IEEE transactions on electron devices (01.05.2015)
Published in IEEE transactions on electron devices (01.05.2015)
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Journal Article
Characterization and Modeling of NBTI in Nanoscale UltraThin Body UltraThin Box FD-SOI MOSFETs
Karatsori, Theano A., Theodorou, Christoforos G., Haendler, Sebastien, Planes, Nicolas, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.12.2016)
Published in IEEE transactions on electron devices (01.12.2016)
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Journal Article
Compact Modeling of Nanoscale Trapezoidal FinFETs
Fasarakis, Nikolaos, Karatsori, Theano A., Tsormpatzoglou, Andreas, Tassis, Dimitrios H., Papathanasiou, Konstantinos, Bucher, Matthias, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.02.2014)
Published in IEEE transactions on electron devices (01.02.2014)
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Journal Article
Study of Hot-Carrier-Induced Traps in Nanoscale UTBB FD-SOI MOSFETs by Low-Frequency Noise Measurements
Karatsori, Theano A., Theodorou, Christoforos G., Mescot, Xavier, Haendler, Sebastien, Planes, Nicolas, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.08.2016)
Published in IEEE transactions on electron devices (01.08.2016)
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Journal Article
Analytical Modeling of Threshold Voltage and Interface Ideality Factor of Nanoscale Ultrathin Body and Buried Oxide SOI MOSFETs With Back Gate Control
Fasarakis, Nikolaos, Karatsori, Theano, Tassis, Dimitrios H., Theodorou, Christoforos G., Andrieu, Francois, Faynot, Olivier, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.04.2014)
Published in IEEE transactions on electron devices (01.04.2014)
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Journal Article
Origin of low frequency noise in polycrystalline silicon thin-film transistors
Dimitriadis, Charalabos A., Brini, Jean, Kamarinos, George
Published in Thin solid films (03.03.2003)
Published in Thin solid films (03.03.2003)
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Journal Article
Conference Proceeding
Analytical Compact Model for Lightly Doped Nanoscale Ultrathin-Body and Box SOI MOSFETs With Back-Gate Control
Karatsori, Theano A., Tsormpatzoglou, Andreas, Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Planes, Nicolas, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
Published in IEEE transactions on electron devices (01.10.2015)
Published in IEEE transactions on electron devices (01.10.2015)
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Journal Article
Compact Model of Drain Current in Short-Channel Triple-Gate FinFETs
Fasarakis, N., Tsormpatzoglou, A., Tassis, D. H., Pappas, I., Papathanasiou, K., Bucher, M., Ghibaudo, G., Dimitriadis, C. A.
Published in IEEE transactions on electron devices (01.07.2012)
Published in IEEE transactions on electron devices (01.07.2012)
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Journal Article
Threshold Voltage Model for Short-Channel Undoped Symmetrical Double-Gate MOSFETs
Tsormpatzoglou, A., Dimitriadis, C.A., Clerc, R., Pananakakis, G., Ghibaudo, G.
Published in IEEE transactions on electron devices (01.09.2008)
Published in IEEE transactions on electron devices (01.09.2008)
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Journal Article
Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements
Tsormpatzoglou, Andreas, Hastas, Nikolaos A., Mahmoudabadi, Forough, Choi, Nackbong, Hatalis, Miltiadis K., Dimitriadis, Charalabos A.
Published in IEEE electron device letters (01.11.2013)
Published in IEEE electron device letters (01.11.2013)
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Journal Article