Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs
Karatsori, T.A., Theodorou, C.G., Haendler, S., Dimitriadis, C.A., Ghibaudo, G.
Published in Solid-state electronics (01.02.2017)
Published in Solid-state electronics (01.02.2017)
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Journal Article
Threshold Voltage Model for Short-Channel Undoped Symmetrical Double-Gate MOSFETs
Tsormpatzoglou, A., Dimitriadis, C.A., Clerc, R., Pananakakis, G., Ghibaudo, G.
Published in IEEE transactions on electron devices (01.09.2008)
Published in IEEE transactions on electron devices (01.09.2008)
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Journal Article
Influence of AC signal oscillator level on effective mobility measurement by split C–V technique in MOSFETs
Karatsori, T.A, Theodorou, C.G, Dimitriadis, C.A, Ghibaudo, G
Published in Electronics letters (18.08.2016)
Published in Electronics letters (18.08.2016)
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Journal Article
Impact of low-frequency noise variability on statistical parameter extraction in ultra-scaled CMOS devices
Ioannidis, E.G, Theodorou, C.G, Haendler, S, Dimitriadis, C.A, Ghibaudo, G
Published in Electronics letters (11.09.2014)
Published in Electronics letters (11.09.2014)
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Journal Article
Impact of dynamic variability on the operation of CMOS inverter
Ioannidis, E.G, Haendler, S, Manceau, J.-P, Dimitriadis, C.A, Ghibaudo, G
Published in Electronics letters (12.09.2013)
Published in Electronics letters (12.09.2013)
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Journal Article
On-current modeling of large-grain polycrystalline silicon thin-film transistors
Farmakis, F.V., Brini, J., Kamarinos, G., Angelis, C.T., Dimitriadis, C.A., Miyasaka, M.
Published in IEEE transactions on electron devices (01.04.2001)
Published in IEEE transactions on electron devices (01.04.2001)
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Journal Article
On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries
Hatzopoulos, A.T., Tassis, D.H., Hastas, N.A., Dimitriadis, C.A., Kamarinos, G.
Published in IEEE transactions on electron devices (01.08.2005)
Published in IEEE transactions on electron devices (01.08.2005)
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Journal Article
An analytical hot-carrier induced degradation model in polysilicon TFTs
Hatzopoulos, A.T., Tassis, D.H., Hastas, N.A., Dimitriadis, C.A., Kamarinos, G.
Published in IEEE transactions on electron devices (01.10.2005)
Published in IEEE transactions on electron devices (01.10.2005)
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Journal Article
Stability of Amorphous-Silicon and Nanocrystalline Silicon Thin-Film Transistors Under DC and AC Stress
Hatzopoulos, A.T., Arpatzanis, N.., Tassis, D.H., Dimitriadis, C.A., Templier, F.., Oudwan, M.., Kamarinos, G..
Published in IEEE electron device letters (01.09.2007)
Published in IEEE electron device letters (01.09.2007)
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Journal Article
Effect of Channel Width on the Electrical Characteristics of Amorphous/Nanocrystalline Silicon Bilayer Thin-Film Transistors
Hatzopoulos, Argyrios T., Arpatzanis, Nikolaos, Tassis, Dimitrios H., Dimitriadis, Charalabos A., Templier, Franois, Oudwan, Maher, Kamarinos, George
Published in IEEE transactions on electron devices (01.05.2007)
Published in IEEE transactions on electron devices (01.05.2007)
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Journal Article
Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements
Hatzopoulos, A.T., Arpatzanis, N., Tassis, D.H., Dimitriadis, C.A., Oudwan, M., Templier, F., Kamarinos, G.
Published in IEEE transactions on electron devices (01.05.2007)
Published in IEEE transactions on electron devices (01.05.2007)
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Journal Article
Effect of Channel Width Shortening on the Stability of a-Si:H/nc-Si:H Bilayer Thin-Film Transistors
Pappas, I., Dimitriadis, C.A., Siskos, S., Templier, F., Oudwan, M., Kamarinos, G.
Published in IEEE electron device letters (01.08.2008)
Published in IEEE electron device letters (01.08.2008)
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Journal Article