Loading…
MHD Flow of Non-Newtonian Molybdenum Disulfide Nanofluid in a Converging/Diverging Channel with Rosseland Radiation
Raza, J., Mebarek-Oudina, Fateh, Ram, Paras, Sharma, S.
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (01.05.2020)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (01.05.2020)
Get full text
Journal Article
Loading…
High-Volume SiC Epitaxial Layer Manufacturing-Maintaining High Materials Quality of Lab Results in Production
Thomas, Bernd, Baierhofer, Daniel, Bierhoff, Christian, Staiger, F.
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
MHD Nanofluid Flow Past a Rotating Disk with Thermal Radiation in the Presence of Aluminum and Titanium Alloy Nanoparticles
Gireesha, Bijjanal Jayanna, Monaledi, R.L., Makinde, Oluwole Daniel, Mahanthesh, Basavarajappa, Tshehla, M.S., Shashikumar, N.S.
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (01.05.2018)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (01.05.2018)
Get full text
Journal Article
Loading…
Mechanical Properties of Indentation in Plasma Nitrided and Nitrocarburized Austenitic Stainless Steel AISI 321
Florêncio, Odila, Manfrinato, Marcos Dorigão, Sgarbi Rossino, Luciana, Kliauga, Andrea Madeira
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (12.12.2023)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (12.12.2023)
Get full text
Journal Article
Loading…
SiC MOSFET Gate Oxide Quality Improvement Method in Furnace Thermal Oxidation with Lower Pressure Control
Lee, Junhyoung, Lim, Jesung, Jeong, Changbeom, Im, Young Bin, Kang, Youngkwon, Lee, Jungho, Son, Seong Pil, Kim, Chung Jung, Kim, In Kyu
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Analysis of Lattice Damage in 4H-SiC Epiwafers Implanted with High Energy Al Ions at Elevated Temperatures
Hu, Shanshan, Cheng, Qian Yu, Ghandi, Reza, Chen, Ze Yu, Dudley, Michael, Raghothamachar, Balaji, Kennerly, Stacey, Steski, Dannie, Carlson, Charles, Liu, Yafei
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Loading…
Loading…
Body Diode Reliability of 4H-SiC MOSFETs as a Function of Epitaxial Process Parameter
Maslougkas, Sotirios, Domeij, Martin, Justice, Joshua, Das, Hrishikesh, Pham, Thanh Toan, Kochoska, Sara, Franchi, Jimmy, Sunkari, Swapna
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Practical Improvement of Noncontact Production Monitoring of Doping in SiC Wafers with Extended Epilayer Defects
Schrayer, Bret, Gutierrez, Lilliana, Savtchouk, Alexandre, Almeida, Carlos, Lagowski, Jacek, Wilson, Marshall
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Analysis of Forward Bias Degradation Reduction in 4H-SiC PiN Diodes on Bonded Substrates
Kojima, Kazutoshi, Hatta, Naoki, Masumoto, Keiko, Harada, Shinsuke, Ozono, Kunihide, Ishikawa, Seiji, Uchida, Hidetsugu, Kurihara, Shunsuke, Kobayashi, Motoki
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Epitaxial Defectivity Characterization Combining Surface Voltage and Photoluminescence Mapping on 200mm 4H-SiC Wafers
Polisski, Gennadi, Magnusson, Björn, Thörnberg, Jimmy, Isacson, Mathias, Carria, Egidio
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Study on Quantification of Correlation between Current Density and UV Irradiation Intensity, Leading to Bar Shaped 1SSF Expansion
Takano, Kazumi, Matsushita, Yohsuke, Igarashi, Yasuyuki, Morita, Takuya
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Investigation of BPD Faulting under Extreme Carrier Injection in Room vs High Temperature Implanted 3.3kV SiC MOSFETs
Mahadik, Nadeemullah A., Soto, Jake, Kallon, Elias M., Stahlbush, Robert E., Odekirk, Bruce, Liao, Michael E., Mastro, Michael E.
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Crystal Originated Defect Monitoring and Reduction in Production Grade SmartSiC™ Engineered Substrates
Drouin, Alexis, Zielinski, Marcin, Cela, Enrica, Chagneux, Valentine, Maleville, Christophe, Alassaad, Kassem, Schwarzenbach, Walter, Chapelle, Audrey, Rouchier, Séverin
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Loading…
Analysis of Defect Structures during the Early-Stages of PVT Growth of 4H-SiC Crystals
Dukes, Douglas, Zhu, Yi Mei, Young, Liam, Liu, Chu Hang, Bricetti, Hunter, Liu, Yafei, Chen, Ze Yu, Griswold, Samantha, Cheng, Qian Yu, Raghothamachar, Balaji, Dudley, Michael, Hu, Shanshan, Torres, Victor
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Investigation of Dislocation Behaviors in 4H-SiC Substrate during Post-Growth Thermal Treatment
Peng, Hong Yu, Shi, Zhi Qiang, Gao, Chao, Dudley, Michael, Raghothamachar, Balaji, Pan, Ya Ni, Gao, Yu Han, Zhu, Can
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article
Loading…
Loading…
A Study of Process Interruptions during Pre- and Post-Buffer Layer Epitaxial Growth for Defect Reduction in 4H SiC
Wu, Jun, Pushkarev, Vladimir, Rana, Tawhid, Manning, Ian
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (22.08.2024)
Get full text
Journal Article