X-ray Photon Counting and Two-Color X-ray Imaging Using Indirect Detection
Dierickx, Bart, Yao, Qiang, Witvrouwen, Nick, Uwaerts, Dirk, Vandewiele, Stijn, Gao, Peng
Published in Sensors (Basel, Switzerland) (26.05.2016)
Published in Sensors (Basel, Switzerland) (26.05.2016)
Get full text
Journal Article
The Argo: a high channel count recording system for neural recording in vivo
Sahasrabuddhe, Kunal, Khan, Aamir A, Singh, Aditya P, Stern, Tyler M, Ng, Yeena, Tadić, Aleksandar, Orel, Peter, LaReau, Chris, Pouzzner, Daniel, Nishimura, Kurtis, Boergens, Kevin M, Shivakumar, Sashank, Hopper, Matthew S, Kerr, Bryan, Hanna, Mina-Elraheb S, Edgington, Robert J, McNamara, Ingrid, Fell, Devin, Gao, Peng, Babaie-Fishani, Amir, Veijalainen, Sampsa, Klekachev, Alexander V, Stuckey, Alison M, Luyssaert, Bert, Kozai, Takashi D Y, Xie, Chong, Gilja, Vikash, Dierickx, Bart, Kong, Yifan, Straka, Malgorzata, Sohal, Harbaljit S, Angle, Matthew R
Published in Journal of neural engineering (24.02.2021)
Published in Journal of neural engineering (24.02.2021)
Get full text
Journal Article
Total dose and displacement damage effects in a radiation-hardened CMOS APS
Bogaerts, J., Dierickx, B., Meynants, G., Uwaerts, D.
Published in IEEE transactions on electron devices (01.01.2003)
Published in IEEE transactions on electron devices (01.01.2003)
Get full text
Journal Article
A logarithmic response CMOS image sensor with on-chip calibration
Kavadias, S., Dierickx, B., Scheffer, D., Alaerts, A., Uwaerts, D., Bogaerts, J.
Published in IEEE journal of solid-state circuits (01.08.2000)
Published in IEEE journal of solid-state circuits (01.08.2000)
Get full text
Journal Article
Indirect X-ray photon-counting image sensor with 27T pixel and 15e−rms accurate threshold
Dierickx, B, Dupont, B, Defernez, A, Ahmed, N
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)
Get full text
Conference Proceeding
Random addressable 2048×2048 active pixel image sensor
Scheffer, D., Dierickx, B., Meynants, G.
Published in IEEE transactions on electron devices (01.10.1997)
Published in IEEE transactions on electron devices (01.10.1997)
Get full text
Journal Article
At Tape-out: Can System Yield in Terms of Timing/Energy Specifications Be Predicted?
Papanikolaou, Antonis, Miranda, Miguel, Marchal, Pol, Dierickx, Bart, Catthoor, Francky
Published in 2007 IEEE Custom Integrated Circuits Conference (01.09.2007)
Published in 2007 IEEE Custom Integrated Circuits Conference (01.09.2007)
Get full text
Conference Proceeding