Extending the emission wavelength of Ge nanopillars to 2.25 μm using silicon nitride stressors
Millar, R W, Gallacher, K, Samarelli, A, Frigerio, J, Chrastina, D, Isella, G, Dieing, T, Paul, D J
Published in Optics express (13.07.2015)
Published in Optics express (13.07.2015)
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Journal Article
Expanding the Ge emission wavelength to 2.25μm with SixNy strain engineering
Millar, R.W., Gallacher, K., Samarelli, A., Frigerio, J., Chrastina, D., Dieing, T., Isella, G., Paul, D.J.
Published in Thin solid films (01.03.2016)
Published in Thin solid films (01.03.2016)
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Journal Article
The power of confocal raman-AFM and raman-SEM (RISE) imaging in polymer research
Schmidt, Ute, Liu, Wei, Yang, Jianyong, Dieing, T., Weishaupt, Klaus
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Journal Article
Ancient microbial activity recorded in fracture fillings from granitic rocks (Äspö Hard Rock Laboratory, Sweden)
HEIM, C., LAUSMAA, J., SJÖVALL, P., TOPORSKI, J., DIEING, T., SIMON, K., HANSEN, B. T., KRONZ, A., ARP, G., REITNER, J., THIEL, V.
Published in Geobiology (01.07.2012)
Published in Geobiology (01.07.2012)
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Journal Article
Characterization of Carbon Nanomaterials with a confocal Raman-AFM
Schmidt, U., Dieing, T., Weishaupt, K., Liu, W., Yang, J.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Characterisation of a nitrogen ECR plasma source for the MBE growth of the dilute nitride semiconductor GaAsN
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Journal Article
Conference Proceeding
Confocal Raman AFM Imaging of Pharmaceutical Samples
Schmidt, U, Jauss, A, Dieing, T, Vargas, F, Hollricher, O
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Journal Article
High-resolution X-ray diffraction studies of molecular beam epitaxy-grown HgCdTe heterostructures and CdZnTe substrates
SEWELL, R. H, MUSCA, C. A, DELL, J. M, FARAONE, L, USHER, B. F, DIEING, T
Published in Journal of electronic materials (01.06.2005)
Published in Journal of electronic materials (01.06.2005)
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Conference Proceeding
Journal Article
Micro-SAXS and force/strain measurements during the tensile deformation of single struts of an elastomeric polyurethane foam
Martin, C., Eeckhaut, G., Mahendrasingam, A., Blundell, D. J., Fuller, W., Oldman, R. J., Bingham, S. J., Dieing, T., Riekel, C.
Published in Journal of synchrotron radiation (01.07.2000)
Published in Journal of synchrotron radiation (01.07.2000)
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Journal Article
3D Confocal Raman Imaging of Transparent and Opaque Samples
Schmidt, U, Yang, J, Liu, W, Jauss, A, Dieing, T
Published in Microscopy and microanalysis (01.07.2011)
Published in Microscopy and microanalysis (01.07.2011)
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Journal Article
Radius of curvature in MBE grown heterostructures
Dieing, T., Usher, B.F.
Published in COMMAD 2000 Proceedings. Conference on Optoelectronic and Microelectronic Materials and Devices (2000)
Published in COMMAD 2000 Proceedings. Conference on Optoelectronic and Microelectronic Materials and Devices (2000)
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Conference Proceeding
Reciprocal Space Mapping of MBE-Grown HgCdTe Heterostructures
Sewell, R.H., Musca, C.A., Dell, J.M., Faraone, L., Dieing, T., Usher, B.
Published in Conference on Optoelectronic and Microelectronic Materials and Devices, 2004 (2004)
Published in Conference on Optoelectronic and Microelectronic Materials and Devices, 2004 (2004)
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Conference Proceeding
X-ray Microdiffraction Study of Chain Orientation in Poly(p-phenylene terephthalamide)
Riekel, Christian, Dieing, Thomas, Engström, Per, Vincze, Laszlo, Martin, Chris, Mahendrasingam, Arumugam
Published in Macromolecules (16.11.1999)
Published in Macromolecules (16.11.1999)
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Journal Article
Determination of the distribution of process induced strain in silicon by confocal Raman microscopy
Vander Wood, T.B., Dieing, T., Schmidt, U.
Published in 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) (01.06.2009)
Published in 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) (01.06.2009)
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Conference Proceeding
High Temperature Growth of the Dilute Nitride GaAsN using a Nitrogen ECR Plasma Source
Usher, B., Warminski, T., Dieing, T., Prince, K.
Published in 2006 International Conference on Nanoscience and Nanotechnology (01.07.2006)
Published in 2006 International Conference on Nanoscience and Nanotechnology (01.07.2006)
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Conference Proceeding
Structural and Optical Characterisation of
Hatch, S.D., Becker, C.R., Saunders, M., Sewell, R.H., Dieing, T., Dell, J.M., Stamps, R.L.
Published in Conference on Optoelectronic and Microelectronic Materials and Devices, 2004 (2004)
Published in Conference on Optoelectronic and Microelectronic Materials and Devices, 2004 (2004)
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Conference Proceeding