SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions
Dianoux, Raphaelle, Scheidemann, Adi, Niehuis, Ewald, Mollers, Rudolf, Kollmer, Felix, Arlinghaus, Henrik, Hug, Hans-Josef, Bernard, Laetitia, Vranjkovic, Sasa
Published in Microscopy and microanalysis (01.08.2015)
Published in Microscopy and microanalysis (01.08.2015)
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Journal Article
In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures
Niehuis, Ewald, Moellers, Rudolf, Kollmer, Felix, Arlinghaus, Henrik, Bernard, Laetita, Josef Hug, Hans, Vranjkovic, Sasa, Dianoux, Raphaelle, Scheidemann, Adi
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy
Marchi, F., Dianoux, R., Smilde, H.J.H., Mur, P., Comin, F., Chevrier, J.
Published in Journal of electrostatics (01.09.2008)
Published in Journal of electrostatics (01.09.2008)
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Journal Article
Charging dynamics and strong localization of a two-dimensional electron cloud
Dianoux, R, Smilde, H J H, Marchi, F, Buffet, N, Mur, P, Comin, F, Chevrier, J
Published in Nanotechnology (15.08.2007)
Published in Nanotechnology (15.08.2007)
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