A detailed investigation of the quantum yield experiment
Ielmini, D., Spinelli, A.S., Lacaita, A.L., DiMaria, D.J., Ghidini, G.
Published in IEEE transactions on electron devices (01.08.2001)
Published in IEEE transactions on electron devices (01.08.2001)
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Journal Article
Reliability projection for ultra-thin oxides at low voltage
Stathis, J.H., DiMaria, D.J.
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)
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Conference Proceeding
Interface traps induced by hole trapping in metal-oxide semiconductor devices
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Journal Article
Conference Proceeding
Oxide scaling limit for future logic and memory technology
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Journal Article
Conference Proceeding
Atomic hydrogen-induced degradation of thin SiO2 gate oxides
CARTIER, E, BUCHANAN, D. A, STATHIS, J. H, DIMARIA, D. J
Published in Journal of non-crystalline solids (01.07.1995)
Published in Journal of non-crystalline solids (01.07.1995)
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Conference Proceeding
Journal Article
Atomic hydrogen-induced degradation of thin SiO 2 gate oxides
Cartier, E., Buchanan, D.A., Stathis, J.H., DiMaria, D.J.
Published in Journal of non-crystalline solids (1995)
Published in Journal of non-crystalline solids (1995)
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Journal Article
Thin oxide discussion group summary moderators
DiMaria, D.J., Suehle, J.S.
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)
Published in 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) (2000)
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Conference Proceeding