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Small area versus narrow line width effects on the C49 to C54 transformation of TiSi/sub 2
by
DiGregorio
,
J.F
.
,
Wall, R.N.
Published in
IEEE transactions on electron devices
(01.02.2000)
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Small area versus narrow line width effects on the C49 to C54 transformation of TiSi2
by
DiGregorio
,
J.F
,
Wall, R.N
Published in
IEEE transactions on electron devices
(01.02.2000)
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A technique for measuring residual stress in SiC whiskers within an alumina matrix through Raman spectroscopy
by
DIGREGORIO, J. F
,
FURTAK, T. E
,
PETROVIC, J. J
Published in
Journal of applied physics
(01.04.1992)
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Raman scattering by surface phonon-polaritons in large SiC microcrystals
by
DiGregorio
,
J.F
.
,
Furtak, T.E.
Published in
Solid state communications
(1994)
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