Influence of Package Trace Properties on CDM Stress
Di Sarro, James P., Reynolds, Bill, Gauthier, Robert
Published in IEEE transactions on device and materials reliability (01.09.2014)
Published in IEEE transactions on device and materials reliability (01.09.2014)
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Magazine Article
ESD NETWORK COMPRISING VARIABLE IMPEDANCE DISCHARGE PATH
Concannon, Ann Margaret, Rajagopal, Krishna Praveen Mysore, Di Sarro, James P, Dissegna, Mariano, Wang, Lihui
Year of Publication 28.03.2019
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Year of Publication 28.03.2019
Patent
Structure and method for dynamic biasing to improve ESD robustness of current mode logic (CML) drivers
Jack, Nathan D, Gauthier, Robert J, Mitra, Souvick, Di Sarro, James P, Li, JunJun
Year of Publication 15.01.2019
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Year of Publication 15.01.2019
Patent
IGBT coupled to a reverse bias device in series
Mysore Rajagopal, Krishna Praveen, Salman, Akram A, Ali, Muhammad Yusuf, Appaswamy, Aravind Chennimalai, Di Sarro, James P
Year of Publication 02.04.2019
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Year of Publication 02.04.2019
Patent