by Yazigy, N., Postel-Pellerin, J., Marca, V. Della, Terziyan, K., Sousa, R. C., Canet, P., Pendina, G. Di
Published in IEEE journal of the Electron Devices Society (2022)

by Chavent, A., Iurchuk, V., Tillie, L., Bel, Y., Lamard, N., Vila, L., Ebels, U., Sousa, R.C., Dieny, B., di Pendina, G., Prenat, G., Langer, J., Wrona, J., Prejbeanu, I.L.
Published in Journal of magnetism and magnetic materials (01.07.2020)

by Jabeur, K, Di Pendina, G, Prenat, G
Published in Electronics letters (10.04.2014)

by Jabeur, K, Bernard-Granger, F, Di Pendina, G, Prenat, G, Dieny, B
Published in Electronics letters (11.09.2014)

by Zianbetov, E., Beigne, E., Pendina, G. Di
Published in 2015 21st IEEE International Symposium on Asynchronous Circuits and Systems (01.05.2015)

by Sousa, R. C., Chavent, A., Iurchuk, V., Vila, L., Ebels, U., Dieny, B., di Pendina, G., Prenat, G., Langer, J., Wrona, J., Prejbeanu, I. L.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Prenat, G., Di Pendina, G., Layer, C., Goncalves, O., Jaber, K., Dieny, B., Sousa, R., Prejbeanu, I. L., Nozieres, J. P.
Published in 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2014)

by Xhafa, X., Ladhar, A., Faehn, E., Anghel, L., Di Pendina, G., Girard, P., Virazel, A.
Published in 2023 IEEE European Test Symposium (ETS) (22.05.2023)

by Kharbouche-Harrari, M., Alhalabi, R., Postel-Pellerin, J., Wacquez, R., Aboulkassimi, D., Nowak, E., Prejbeanu, I.L., Prenat, G., Pendina, G. Di
Published in 2018 Conference on Design of Circuits and Integrated Systems (DCIS) (01.11.2018)

by Yazigy, N., Postel-Pellerin, J., Marca, V. Della, Sousa, R.C., Di Pendina, G., Canet, P.
Published in Microelectronics and reliability (01.11.2023)

by Yazigy, N., Postel-Pellerin, J., Marca, V. Della, Terziyan, K., Nadifi, S., Sousa, R.C., Canet, P., Di Pendina, G.
Published in Microelectronics and reliability (01.11.2022)

by Kharbouche-Harrari, M., Wacquez, R., Pendina, G. Di, Dutertre, J.-M., Postel-Pellerin, J., Aboulkassimi, D., Portal, J.-M.
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)

by Beigne, E., Christmann, J.-F, Zianbetov, E., Di Pendina, G.
Published in 2015 European Conference on Circuit Theory and Design (ECCTD) (01.08.2015)

by Kharbouche-Harrari, M., Di Pendina, G., Wacquez, R., Dieny, B., Aboulkassimi, D., Postel-Pellerin, J., Portal, J.-M.
Published in 2019 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2019)

by Tahoori, M., Nair, S.M., Bishnoi, R., Torres, L., Senni, S., Patrigeon, G., Benoit, P., Pendina, G. Di, Prenat, G.
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)

by Tahoori, M., Nair, S. M., Bishnoi, R., Senni, S., Mohdad, J., Mailly, F., Torres, L., Benoit, P., Gamatie, A., Nouet, P., Ouattara, F., Sassatelli, G., Jabeur, K., Vanhauwaert, P., Atitoaie, A., Firastrau, I., Di Pendina, G., Prenat, G.
Published in 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2018)

by Courtois, B., Torki, K., Dumont, S., Eyraud, S., Paillotin, J.-F., di Pendina, G.
Published in 2009 22nd International Conference on VLSI Design (01.01.2009)

by Kharbouche-Harrari, M., Postel-Pellerin, J., Di Pendina, G., Wacquez, R., Aboulkassimi, D., Bocquet, M., Sousa, R., Delattre, R., Portal, J. -M.
Published in 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) (01.07.2018)

by Jabeur, K., Prenat, G., Di Pendina, G., Buda-Prejbeanu, L. D., Prejbeanu, I. L., Dieny, B.
Published in 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG) (01.09.2013)

by Courtois, B., Charlot, B., Di Pendina, G., Rufer, L.
Published in 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop (01.06.2008)