by Boughaleb, J, Monfray, S, Vine, G, Cottinet, P J, Arnaud, A, Boisseau, S, Duret, A B, Quenard, S, Puscasu, O, Maitre, C, Trochut, S, Hasbani, F, Di Gilio, T, Heinrich, V, Urard, P, Grasset, J C, Boeuf, F, Guyomar, D, Skotnicki, T
Published in Journal of physics. Conference series (27.11.2014)

by Di Gilio, T., Bravaix, A.
Published in 2005 IEEE International Integrated Reliability Workshop (2005)

by Jacquet, D., Cesana, G., Flatresse, P., Arnaud, F., Menut, P., Hasbani, F., Di Gilio, T., Lecocq, C., Roy, T., Chhabra, A., Grover, C., Minez, O., Uginet, J., Durieu, G., Nyer, F., Adobati, C., Wilson, R., Casalotto, D.
Published in 2013 Symposium on VLSI Technology (01.06.2013)

by Jacquet, D., Cesana, G., Flatresse, P., Arnaud, F., Menut, P., Hasbani, F., Di Gilio, T., Lecocq, C., Roy, T., Chhabra, A., Grover, C., Minez, O., Uginet, J., Durieu, G., Nyer, F., Adobati, C., Wilson, R., Casalotto, D.
Published in 2013 Symposium on VLSI Circuits (01.06.2013)

by DI GILIO THIERRY
Year of Publication 01.01.2019