The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future
Ramdani, M., Sicard, E., Boyer, A., Ben Dhia, S., Whalen, J.J., Hubing, T.H., Coenen, M., Wada, O.
Published in IEEE Transactions on Electromagnetic Compatibility (01.02.2009)
Published in IEEE Transactions on Electromagnetic Compatibility (01.02.2009)
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Book Review
Journal Article
Characterization of Changes in LDO Susceptibility After Electrical Stress
Jianfei Wu, Boyer, Alexandre, Jiancheng Li, Ben Dhia, Sonia, Rongjun Shen
Published in IEEE transactions on electromagnetic compatibility (01.10.2013)
Published in IEEE transactions on electromagnetic compatibility (01.10.2013)
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Journal Article
Performance Charaterisation of the Decoupling Capacitor Network using the Near-Field Measurement
Serpaud, Sebastien, Coccetti, Fabio, Boyer, Alexandre, Dhia, Sonia Ben
Published in 2023 International Symposium on Electromagnetic Compatibility – EMC Europe (04.09.2023)
Published in 2023 International Symposium on Electromagnetic Compatibility – EMC Europe (04.09.2023)
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Conference Proceeding
Passive Cell Balancing Impact On Injection Levels During Direct Power injection on Battery Cell Controller
Guendouz, Badr, Abouda, Kamel, Boyer, Alexandre, Dhia, Sonia Ben, Aribaud, Matthieu
Published in 2023 International Symposium on Electromagnetic Compatibility – EMC Europe (04.09.2023)
Published in 2023 International Symposium on Electromagnetic Compatibility – EMC Europe (04.09.2023)
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Conference Proceeding
Analytical Approach of The High Susceptibility Frequencies of a Battery Management System During Direct Power Injection. Methods of Improvement
Guendouz, Badr, Abouda, Kamel, Boyer, Alexandre, Dhia, Sonia Ben, Tico, Olivier, Ruau, Jeremy
Published in 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI) (29.07.2023)
Published in 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI) (29.07.2023)
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Conference Proceeding
A Comparative Study of DPI levels on BMS IC With an On-Hand Analytical Model to Predict Resonances
Guendouz, Badr, Abouda, Kamel, Boyer, Alexandre, Dhia, Sonia Ben, Mediouni, Hiba, Dietsch, Jerome
Published in 2022 International Symposium on Electromagnetic Compatibility – EMC Europe (05.09.2022)
Published in 2022 International Symposium on Electromagnetic Compatibility – EMC Europe (05.09.2022)
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Conference Proceeding
Experimental Investigations into the Effects of Electrical Stress on Electromagnetic Emission from Integrated Circuits
Boyer, Alexandre, Ben Dhia, Sonia, Binhong Li, Berbel, Nestor, Fernandez-Garcia, Raul
Published in IEEE transactions on electromagnetic compatibility (01.02.2014)
Published in IEEE transactions on electromagnetic compatibility (01.02.2014)
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Journal Article
Publication
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations
Dhia, S., Boyer, A., Vrignon, B., Deobarro, M., Dinh, T. V.
Published in IEEE transactions on instrumentation and measurement (01.03.2012)
Published in IEEE transactions on instrumentation and measurement (01.03.2012)
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Journal Article
Passive device degradation models for an electromagnetic emission robustness study of a buck DC-DC converter
He, Huang, Boyer, Alexandre, Ben Dhia, Sonia
Published in 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.08.2015)
Published in 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.08.2015)
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Conference Proceeding
Journal Article
A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC
Guendouz, Badr, Perruchoud, Philippe, Abouda, Kamel, Boyer, Alexandre, Dhia, Sonia Ben
Published in 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) (01.09.2022)
Published in 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) (01.09.2022)
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Conference Proceeding
A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change
Chetouani, Saliha, Boyer, Alexandre, Dhia, Sonia Ben, Serpaud, Sebastien, Durier, Andre
Published in 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) (09.03.2022)
Published in 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) (09.03.2022)
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Conference Proceeding
Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests
Durier, Andre, Dhia, Sonia Ben, Dubois, Tristan
Published in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2019)
Published in 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2019)
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Conference Proceeding