Multiple fault activation cycle tests for transistor stuck-open faults
Devta-Prasanna, N, Gunda, A, Reddy, S M, Pomeranz, I
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
Comparative study of centralised and distributed compatibility-based test data compression
AI-YAMANI, A, DEVTA-PRASANNA, N, GUNDA, A
Published in IET computers & digital techniques (01.03.2008)
Published in IET computers & digital techniques (01.03.2008)
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Journal Article
Effective and Efficient Test Pattern Generation for Small Delay Defect
Goel, S.K., Devta-Prasanna, N., Turakhia, R.P.
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
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Conference Proceeding
On the Detectability of Scan Chain Internal Faults An Industrial Case Study
Yang, F., Chakravarty, S., Devta-Prasanna, N., Reddy, S.M., Pomeranz, I.
Published in 26th IEEE VLSI Test Symposium (vts 2008) (01.04.2008)
Published in 26th IEEE VLSI Test Symposium (vts 2008) (01.04.2008)
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Conference Proceeding
Silicon evaluation of faster than at-speed transition delay tests
Chakravarty, S., Devta-Prasanna, N., Gunda, A., Ma, J., Yang, F., Guo, H., Lai, R., Li, D.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
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Conference Proceeding
A novel method for fast identification of peak current during test
Wei Zhao, Chakravarty, S., Junxia Ma, Devta-Prasanna, N., Fan Yang, Tehranipoor, M.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
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Conference Proceeding
Detection of Internal Stuck-open Faults in Scan Chains
Yang, F., Chakravarty, S., Devta-Prasanna, N., Reddy, S.M., Pomeranz, I.
Published in 2008 IEEE International Test Conference (01.10.2008)
Published in 2008 IEEE International Test Conference (01.10.2008)
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Conference Proceeding
Accurate measurement of small delay defect coverage of test patterns
Devta-Prasanna, N., Goel, S.K., Gunda, A., Ward, M., Krishnamurthy, P.
Published in 2009 International Test Conference (01.11.2009)
Published in 2009 International Test Conference (01.11.2009)
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Conference Proceeding
Improving the Detectability of Resistive Open Faults in Scan Cells
Fan Yang, Chakravarty, S., Devta-Prasanna, N., Reddy, S.M., Pomeranz, I.
Published in 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (01.10.2009)
Published in 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (01.10.2009)
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Conference Proceeding
Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells
Fan Yang, Chakravarty, S., Devta-Prasanna, N., Reddy, S.M., Pomeranz, I.
Published in 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems (01.10.2008)
Published in 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems (01.10.2008)
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Conference Proceeding
Detectability of internal bridging faults in scan chains
Yang, F., Chakravarty, S., Devta-Prasanna, N., Reddy, S. M., Pomeranz, I.
Published in Proceedings of the 2009 Asia and South Pacific Design Automation Conference (19.01.2009)
Published in Proceedings of the 2009 Asia and South Pacific Design Automation Conference (19.01.2009)
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Conference Proceeding
Detectability of internal bridging faults in scan chains
Yang, F., Chakravarty, S., Devta-Prasanna, N., Reddy, S.M., Pomeranz, I.
Published in 2009 Asia and South Pacific Design Automation Conference (01.01.2009)
Published in 2009 Asia and South Pacific Design Automation Conference (01.01.2009)
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Conference Proceeding
An Enhanced Logic BIST Architecture for Online Testing
Yang, F., Chakravarty, S., Devta-Prasanna, N., Reddy, S.M., Pomeranz, S.M.R.
Published in 2008 14th IEEE International On-Line Testing Symposium (01.07.2008)
Published in 2008 14th IEEE International On-Line Testing Symposium (01.07.2008)
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Conference Proceeding
Systematic Scan Reconfiguration
Al-Yamani, A.A., Devta-Prasanna, N., Gunda, A.
Published in 2007 Asia and South Pacific Design Automation Conference (01.01.2007)
Published in 2007 Asia and South Pacific Design Automation Conference (01.01.2007)
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Conference Proceeding