by Kyong Ho Lee, Verma, N.
Published in IEEE journal of solid-state circuits (01.07.2013)

by Kim, Dong-Kwon, Kim, Sung Jin, Bae, Jin-Kwon
Published in International journal of heat and mass transfer (01.07.2009)

by Liu, Sheng-Fu, Huang, Ren-Tsung, Sheu, Wen-Jenn, Wang, Chi-Chuan
Published in International journal of heat and mass transfer (01.05.2009)

by Yang, Yang, Wei, Xiao-Juan, Liu, Jing
Published in Journal of physics. D, Applied physics (21.09.2007)

by Xingsheng Wang, Binjie Cheng, Brown, Andrew Robert, Millar, Campbell, Kuang, Jente B., Nassif, Sani, Asenov, Asen
Published in IEEE transactions on electron devices (01.08.2013)

by Niclass, C., Rochas, A., Besse, P.-A., Charbon, E.
Published in IEEE journal of solid-state circuits (01.09.2005)

by Xu, Wei, Sun, Hongbin, Wang, Xiaobin, Chen, Yiran, Zhang, Tong
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2011)

by Huang, Ren-Tsung, Sheu, Wen-Junn, Wang, Chi-Chuan
Published in International journal of heat and mass transfer (01.05.2008)

by Wong, Kok-Cheong
Published in International communications in heat and mass transfer (01.08.2012)

by Srinivasan, K., Chatha, K.S., Konjevod, G.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2006)

by Ogras, U.Y., Marculescu, R., Marculescu, D., Eun Gu Jung
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2009)

by Schlosser, M., Bhuwalka, K.K., Sauter, M., Zilbauer, T., Sulima, T., Eisele, I.
Published in IEEE transactions on electron devices (01.01.2009)

by Breach, C.D., Wulff, F.W.
Published in Microelectronics and reliability (2010)

by Fengbo Ren, Markovic, Dejan
Published in IEEE transactions on electron devices (01.05.2010)

by Jeng, Tzer-Ming, Tzeng, Sheng-Chung
Published in International journal of thermal sciences (01.12.2007)

by Abdollahi, A., Fallah, F., Pedram, M.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2004)

by Yeh, Jun-Hsien, Tsai, Tsung-Nan
Published in Microelectronics and reliability (01.01.2014)

by Muzychka, Y.S.
Published in International journal of heat and mass transfer (01.07.2005)

by Roberg, M., Popovic, Z.
Published in IEEE transactions on microwave theory and techniques (01.08.2011)

by Ghisi, Aldo, Fachin, Fabio, Mariani, Stefano, Zerbini, Sarah
Published in Microelectronics and reliability (01.03.2009)