High-power diode laser bars and shear strain
Cassidy, Daniel T, Rehioui, O, Hall, Chadwick K, Béchou, L, Deshayes, Y, Kohl, A, Fillardet, T, Ousten, Y
Published in Optics letters (15.05.2013)
Published in Optics letters (15.05.2013)
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Journal Article
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy
Royon, A., Bourhis, K., Béchou, L., Cardinal, T., Canioni, L., Deshayes, Y.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Conference Proceeding
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses
Baillot, R., Deshayes, Y., Bechou, L., Buffeteau, T., Pianet, I., Armand, C., Voillot, F., Sorieul, S., Ousten, Y.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Conference Proceeding
Measurement of the thermal characteristics of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties
Bechou, L., Rehioui, O., Deshayes, Y., Gilard, O., Quadri, G., Ousten, Y.
Published in Optics and laser technology (01.06.2008)
Published in Optics and laser technology (01.06.2008)
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Journal Article
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications
Bourqui, M.L., Béchou, L., Gilard, O., Deshayes, Y., Vecchio, P. Del, How, L.S., Rosala, F., Ousten, Y., Touboul, A.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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Conference Proceeding
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation
Deshayes, Y., Bord, I., Barreau, G., Aiche, M., Moretto, P.H., Béchou, L., Roehrig, A.C., Ousten, Y.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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Conference Proceeding
Life test result on 4 channel VCELs chip used in 28Gb/s data transfer in space application
Joly, S., Ouattara, M., Guibault, G., How, Lip Sun, Bechou, L., Gilard, O., Deshayes, Y.
Published in Microelectronics and reliability (01.11.2023)
Published in Microelectronics and reliability (01.11.2023)
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Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests
MENDIZABAL, L, BECHOU, L, DESHAYES, Y, VERDIER, F, DANTO, Y, LAFFITTE, D, GOUDARD, J. L, HOUE, F
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Conference Proceeding
Simulations of Thermomechanical Stresses and Optical Misalignment in 1550-nm Transmitter Optoelectronic Modules Using FEM and Process Dispersions
Deshayes, Y., Bechou, L., Verdier, F., Ousten, Y., Laffitte, D., Goudard, J.L.
Published in IEEE transactions on components and packaging technologies (01.12.2008)
Published in IEEE transactions on components and packaging technologies (01.12.2008)
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Journal Article
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 μm Laser modules
Deshayes, Y., Bechou, L., Deletage, J.Y., Verdier, F., Danto, Y., Laffitte, D., Goudard, J.L.
Published in Microelectronics and reliability (01.07.2003)
Published in Microelectronics and reliability (01.07.2003)
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Journal Article
Electroluminescence spectroscopy for reliability investigations of 1.55 μm bulk semiconductor optical amplifier
Huyghe, S., Bechou, L., Zerounian, N., Deshayes, Y., Aniel, F., Denolle, A., Laffitte, D., Goudard, J.L., Danto, Y.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Conference Proceeding
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications
DUCHAMP, G, VERDIER, F, DESHAYES, Y, MARC, F, OUSTEN, Y, DANTO, Y
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Conference Proceeding
Impact of 1.55 μm laser diode degradation laws on fibre optic system performances using a system simulator
Mendizabal, L., Verneuil, J.L., Bechou, L., Aupetit-Berthelemot, C., Deshayes, Y., Verdier, F., Dumas, J.M., Danto, Y., Laffitte, D., Goudard, J.L., Hernandez, Y.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Study of Ca1-xPrxF2+x solid solution thin films grown on silicon substrates
TARDY, P, DESHAYES, Y, HIRSCH, L, BARRIERE, A. S, DESBAT, B, EL FAJRI, A
Published in Thin solid films (22.06.1999)
Published in Thin solid films (22.06.1999)
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Journal Article
Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980nm high-power laser diodes
Del Vecchio, P., Curutchet, A., Deshayes, Y., Bettiati, M., Laruelle, F., Labat, N., Béchou, L.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Practical optical gain by an extended Hakki-Paoli method
Vanzi, M., Marcello, G., Mura, G., Le Galès, G., Joly, S., Deshayes, Y., Bechou, L.
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
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Journal Article
Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes
Del Vecchio, P., Curutchet, A., Deshayes, Y., Bettiati, M., Laruelle, F., Labat, N., Béchou, L.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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