X-Ray Topography Research of Dislocation Structure in Epitaxial GeSi Films Grown on Vicinal (001) Si Substrates
Krasotin, A.Y., Kolesnikov, A.V., Trukhanov, E.M., Vasilenko, A.P., Derjabin, A.S., llin, A.S.
Published in International Workshops and Tutorials on Electron Devices and Materials (01.07.2006)
Published in International Workshops and Tutorials on Electron Devices and Materials (01.07.2006)
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