by Haensch, W., Nowak, E. J., Dennard, R. H., Solomon, P. M., Bryant, A., Dokumaci, O. H., Kumar, A., Wang, X., Johnson, J. B., Fischetti, M. V.
Published in IBM journal of research and development (01.07.2006)

by Frank, D.J., Dennard, R.H., Nowak, E., Solomon, P.M., Taur, Y., Hon-Sum Philip Wong
Published in Proceedings of the IEEE (01.03.2001)

by Mandelman, J. A., Dennard, R. H., Bronner, G. B., DeBrosse, J. K., Divakaruni, R., Li, Y., Radens, C. J.
Published in IBM journal of research and development (01.03.2002)

by SHAHIDI, G. G, ANDERSON, C. A, NING, T. H, POLCARI, M. R, WARNOCK, J. D, CHAPPELL, B. A, CHAPPELL, T. I, COMFORT, J. H, DAVARI, B, DENNARD, R. H, FRANCH, R. L, MCFARLAND, P. A, NEELY, J. S
Published in IEEE transactions on electron devices (01.12.1994)

by Assaderaghi, F., Shahidi, G.G., Wagner, L., Hsieh, M., Pelella, M., Chu, S., Dennard, R.H., Davari, B.
Published in IEEE electron device letters (01.06.1997)

by Critchlow, D L, Dennard, R H, Schuster, S E
Published in IBM journal of research and development (01.01.2000)

by Deutsch, A., Kopcsay, G.V., Restle, P.J., Smith, H.H., Katopis, G., Becker, W.D., Coteus, P.W., Surovic, C.W., Rubin, B.J., Dunne, R.P., Gallo, T., Jenkins, K.A., Terman, L.M., Dennard, R.H., Sai-Halasz, G.A., Krauter, B.L., Knebel, D.R.
Published in IEEE transactions on microwave theory and techniques (01.10.1997)

by Luk, W.K., Dennard, R.H.
Published in IEEE journal of solid-state circuits (01.04.2005)

by Luk, W.K., Dennard, R.H.
Published in IEEE transactions on circuits and systems. II, Express briefs (01.05.2005)

by Sun, J.Y.-C., Yuan Taur, Dennard, R.H., Klepner, S.P.
Published in IEEE transactions on electron devices (01.01.1987)

by Hanafi, H.I., Dennard, R.H., Chen, C.-L., Weiss, R.J., Zicherman, D.S.
Published in IEEE journal of solid-state circuits (01.05.1992)

by Chang, L., Montoye, R.K., Nakamura, Y., Batson, K.A., Eickemeyer, R.J., Dennard, R.H., Haensch, W., Jamsek, D.
Published in IEEE journal of solid-state circuits (01.04.2008)

by Baccarani, G, Wordeman, M R, Dennard, R H
Published in IEEE transactions on electron devices (01.01.1984)

by Wordeman, M.R., Schweighart, A.M., Dennard, R.H., Sai-Halasz, G., Molzen, W.W.
Published in IEEE transactions on electron devices (01.01.1985)

by Williams, T.W., Dennard, R.H., Kapur, R., Mercer, M.R., Maly, M.
Published in Proceedings International Test Conference 1996. Test and Design Validity (1996)

by Dennard, R. H., Gaensslen, F. H., Kuhn, L., Yu, H. N.
Published in IEEE Solid-State Circuits Society Newsletter (2007)

by Henkels, W.H., Wen, D.-S., Mohler, R.L., Franch, R.L., Bucelot, T.J., Long, C.W., Bracchitta, J.A., Cote, W.J., Bronner, G.B., Taur, Y., Dennard, R.H.
Published in IEEE journal of solid-state circuits (01.11.1991)

by Dennard, R. H., Gaensslen, F. H., Yu, H. N., Rideout, V. L., Bassous, E., LeBlanc, A.
Published in IEEE Solid-State Circuits Society Newsletter (2007)

by SAI-HALASZ, G. A, WORDEMAN, M. R, CHANG, T. H. P, DENNARD, R. H, KERN, D. P, GANIN, E, RISHTON, S, ZICHERMAN, D. S, SCHMID, H, POLCARI, M. R, NG, H. Y, RESTLE, P. J
Published in IEEE electron device letters (1987)

by Hashemi, P., Kobayashi, M., Majumdar, A., Yang, L. A., Baraskar, A., Balakrishnan, K., Kim, W., Chan, K., Engelmann, S. U., Ott, J. A., Bedell, S. W., Murray, C. E., Liang, S., Dennard, R. H., Sleight, J. W., Leobandung, E., Park, D.-G
Published in 2013 Symposium on VLSI Technology (01.06.2013)