by Denais, Celine M., Gilbert, Rachel M., Isermann, Philipp, McGregor, Alexandra L., te Lindert, Mariska, Weigelin, Bettina, Davidson, Patricia M., Friedl, Peter, Wolf, Katarina, Lammerding, Jan
Published in Science (American Association for the Advancement of Science) (15.04.2016)

by Huard, V., Denais, M., Parthasarathy, C.
Published in Microelectronics and reliability (2006)

by Huard, V., Denais, M., Perrier, F., Revil, N., Parthasarathy, C., Bravaix, A., Vincent, E.
Published in Microelectronics and reliability (2005)

by Huard, V., Denais, M.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Parthasarathy, C.R., Denais, M., Huard, V., Ribes, G., Roy, D., Guerin, C., Perrier, F., Vincent, E., Bravaix, A.
Published in Microelectronics and reliability (01.09.2006)

by Parthasarathy, Cr, Denais, M, Huard, V., Ribes, G., Vincent, E., Bravaix, A.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)

by Bravaix, A., Goguenheim, D., Denais, M., Huard, V., Parthasarathy, C., Perrier, F., Revil, N., Vincent, E.
Published in Microelectronics and reliability (01.09.2005)

by Ribes, G., Bruyère, S., Denais, M., Roy, D., Ghibaudo, G.
Published in Microelectronics and reliability (01.05.2005)

by Ribes, G., Bruyère, S., Denais, M., Monsieur, F., Huard, V., Roy, D., Ghibaudo, G.
Published in Microelectronics and reliability (01.12.2005)

by Huard, V., Parthasarathy, C.R., Denais, M.
Published in 2005 IEEE International Integrated Reliability Workshop (2005)

by Ribes, G, Bruyère, S, Denais, M, Monsieur, F, Huard, V, Roy, D, Ghibaudo, G
Published in Microelectronic engineering (01.04.2004)

by Denais, M., Huard, V., Parthasarathy, C., Ribes, G., Perrier, F., Roy, D., Bravaix, A.
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)

by Tavel, B., Duriez, B., Gwoziecki, R., Basso, M.T., Julien, C., Ortolland, C., Laplanche, Y., Fox, R., Sabouret, E., Detcheverry, C., Boeuf, F., Morin, P., Barge, D., Bidaud, M., Biénacel, J., Garnier, P., Cooper, K., Chapon, J.D., Trouiller, Y., Belledent, J., Broekaart, M., Gouraud, P., Denais, M., Huard, V., Rochereau, K., Difrenza, R., Planes, N., Marin, M., Boret, S., Gloria, D., Vanbergue, S., Abramowitz, P., Vishnubhotla, L., Reber, D., Stolk, P., Woo, M., Arnaud, F.
Published in Solid-state electronics (01.04.2006)

by Ribes, G., Bruyere, S., Denais, M., Roy, D., Ghibaudo, G.
Published in IEEE International Integrated Reliability Workshop Final Report, 2004 (2004)

by Denais, M., Parthasarathy, C., Ribes, G., Rey-Tauriac, Y., Revil, N., Bravaix, A., Huard, V., Perrier, F.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)

by Parthasarathy, C.R., Denais, M., Huard, V., Ribes, G., Vincent, E., Bravaix, A.
Published in 2005 IEEE International Integrated Reliability Workshop (2005)

by Huard, V., Denais, M., Monsieur, F.
Published in IEEE International Integrated Reliability Workshop Final Report, 2004 (2004)

by Ribes, G., Bruyere, S., Denais, M., Roy, D., Ghibaudo, G.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Ribes, G., Bruyere, S., Denais, M., Monsieur, F., Roy, D., Vincent, E., Ghibaudo
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Guerin, C., Huard, V., Bravaix, A., Denais, M., Roux, J.M., Perrier, F., Baks, W.
Published in 2005 IEEE International Integrated Reliability Workshop (2005)