Optical and microstructural properties of TiO2 anti-reflection coatings deposited via in-line APCVD
Davis, K. O., Jiang, K., Demberger, C., Zunft, H., Habermann, D., Schoenfeld, W. V.
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
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Conference Proceeding
Optical modeling of the internal back reflectance of various c-Si dielectric stacks featuring AlOx, SiNx, TiO2 and SiO2
Davis, K.O., Seigneur, H.P., Jiang, K., Demberger, C., Zunft, H., Haverkamp, H., Habermann, D., Schoenfeld, W.V.
Published in 2012 38th IEEE Photovoltaic Specialists Conference (01.06.2012)
Published in 2012 38th IEEE Photovoltaic Specialists Conference (01.06.2012)
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Conference Proceeding
Fast illuminated Lock-In Thermography: An inline shunt detection measurement tool
Seren, S., Hahn, G., Demberger, C., Nagel, H.
Published in 2008 33rd IEEE Photovoltaic Specialists Conference (01.05.2008)
Published in 2008 33rd IEEE Photovoltaic Specialists Conference (01.05.2008)
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Conference Proceeding